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TLC5923 Datasheet(PDF) 3 Page - Texas Instruments |
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TLC5923 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 15 page ![]() www.ti.com AC Characteristics ELECTRICAL CHARACTERISTICS TLC5923 SLVS550 – DECEMBER 2004 V CC = 3 V to 5.5 V, TA = -20°C to 85°C (unless otherwise noted) MIN TYP MAX UNIT fSCLK Clock frequency SCLK 30 MHz twh0/twl0 CLK pulse duration SCLK=H/L 16 ns twh1 XLAT pulse duration XLAT=H 20 ns tsu0 SIN - SCLK ↑ 10 ns tsu1 SCLK ↑-XLAT↓ 10 ns Setup time tsu2 MODE ↑↓-SCLK↑ 10 ns tsu3 MODE ↑↓-XLAT↓ 10 ns th0 SCLK ↑-SIN 10 ns th1 XLAT ↓-SCLK↑ 10 ns Hold time th2 SCLK ↑-MODE↑↓ 10 ns th3 XLAT ↓-MODE↑↓ 10 ns V CC = 3 V to 5.5 V, TA = - 20°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH High-level output voltage IOH = - 1 mA, SOUT VCC -0.5 V VOL Low-level output voltage IOL = 1 mA, SOUT 0.5 V VI = VCC or GND, BLANK, XLAT, SCLK, SIN, II Input current -1 1 µA MODE No data transfer, All output OFF, VO = 1 V, 6 R(IREF) = 10 kΩ No data transfer, All output OFF, VO = 1 V, 12 R(IREF) = 1.3 kΩ ICC Supply current mA Data transfer 30 MHz, All output ON, VO = 1 V, 25 R(IREF) = 1.3 kΩ Data transfer 30 MHz, All output ON, VO = 1 V, 36 65(1) R(IREF) = 600 kΩ IOLC Constant output current All output ON, VO = 1 V, R(IREF) = 600 Ω 70 80 90 mA All output OFF, VO = 15 V, R(IREF) = 600 Ω , ILO0 0.1 µA OUT0 to OUT15 Leakage output current ILO1 VXERR = 5.5 V, No TEF and LOD 10 µA All output ON, VO = 1 V, R(IREF) = 600 Ω, ∆I OLC0 Constant current error ± 1 ± 4 % OUT0 to OUT15 device to device, averaged current from OUT0 ∆I OLC1 Constant current error ± 4 ± 8.5 % to OUT15, R(IREF) = 600 Ω All output ON, VO = 1 V, R(IREF) = 600 Ω, ∆I OLC2 Power supply rejection ratio ± 1 ± 4 %/V OUT0 to OUT15 All output ON, VO = 1 V to 3 V, R(IREF) = 600 ∆I OLC3 Load regulation Ω, ± 2 ± 6 %/V OUT0 to OUT15 T(TEF) Thermal error flag threshold Junction temperature, rising temperature(2) 150 160 180 °C LED open detection V(LOD) 0.3 0.4 V threshold V(IREF) Reference voltage output R(IREF) = 600 Ω 1.20 1.24 1.28 V (1) Measured at device start-up temperature. Once the IC is operating (self heating), lower ICC values will be seen. See Figure 15. (2) Not tested. Specified by design. 3 |
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