AD589MH datasheet(4/13 Pages) AD

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AD7575

–3–

REV. B

TIMING SPECIFICATIONS1

Limit at +25 C

Limit at TMIN, TMAX

Parameter

(All Versions)

(J, K, A, B Versions)

(S, T Versions)

Units

Conditions/Comments

ns min

CS to RD Setup Time

100

120

ns max

RD to BUSY Propagation Delay

100

120

ns max

Data Access Time after

100

120

ns min

RD Pulse Width

ns min

CS to RD Hold Time

100

ns max

Data Access Time after

BUSY

ns min

Data Hold Time

100

ns max

ns min

BUSY to CS Delay

NOTES

1Timing specifications are sample tested at +25

°C to ensure compliance. All input control signals are specified with tr = tf = 20 ns (10% to 90% of +5 V)

and timed from a voltage level of 1.6 V.

3 and t6 are measured with the load circuits of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.

7 is defined as the time required for the data lines to change 0.5 V when loaded with the circuits of Figure 2.

Specifications subject to change without notice.

(VDD = +5 V, VREF = +1.23 V, AGND = DGND = 0 V)

Test Circuits

ABSOLUTE MAXIMUM RATINGS*

VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V

VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V

AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, VDD

Digital Input Voltage to DGND . . . . . . . –0.3 V, VDD + 0.3 V

Digital Output Voltage to DGND . . . . . . –0.3 V, VDD + 0.3 V

CLK Input Voltage to DGND . . . . . . . . . –0.3 V, VDD + 0.3 V

VREF to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, VDD

AIN to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, VDD

Operating Temperature Range

Commercial (J, K Versions) . . . . . . . . . . . . . . 0

°C to +70°C

Industrial (A, B Versions) . . . . . . . . . . . . . –25

°C to +85°C

Extended (S, T Versions) . . . . . . . . . . . . . –55

°C to +125°C

Storage Temperature Range . . . . . . . . . . . . –65

°C to +150°C

Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300

°C

Power Dissipation (Any Package) to +75

°C . . . . . . . 450 mW

Derates above +75

°C by . . . . . . . . . . . . . . . . . . . . . 6 mW/°C

*Stresses above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device. This is a stress rating only; functional operation of the

device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect device reliability.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the AD7575 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

b High-Z to VOL

a. High-Z to VOH

Figure 1. Load Circuits for Data Access Time Test

Figure 2. Load Circuits for Data Hold Time Test

a. VOH to High-Z

b. VOL to High-Z

WARNING!

ESD SENSITIVE DEVICE

DGND

100pF

DBN

DGND

100pF

DBN

+5V

DGND

10pF

DBN

DGND

10pF

DBN

+5V

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