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OP166W Datasheet(PDF) 3 Page - TT Electronics. |
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OP166W Datasheet(HTML) 3 Page - TT Electronics. |
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3 / 4 page ![]() © TT electronics plc General Note TT Electronics reserves the right to make changes in product specification without notice or liability. All information is subject to TT Electronics’ own data and is considered accurate at time of going to print. OP165, OP166 Series Issue C 07/2016 Page 3 OPTEK Technology, Inc. 1645 Wallace Drive, Carrollton, TX 75006|Ph: +1 972 323 2200 www.optekinc.com | www.ttelectronics.com Absolute Maximum Ratings (TA = 25° C unless otherwise noted) Storage and Operating Temperature Range -40 o C to +100o C Reverse Voltage 2.0 V Continuous Forward Current 50 mA Peak Forward Current (1 µs pulse width, 300 pps) 3.0 A Lead Soldering Temperature [1/16 inch (1.6 mm) from case for 5 seconds with soldering iron] 260° C Power Dissipation 100 mW (1) Electrical Specifications Electrical Characteristics (TA = 25° C unless otherwise noted) SYMBOL PARAMETER MIN TYP MAX UNITS TEST CONDITIONS Input Diode EE (APT) Apertured Radiant Incidence OP165A, OP166A 1.95 - - mW/cm 2 IF = 20 mA (2) PO Radiant Power Output OP165W, OP166W 0.50 - - mW IF = 20 mA VF Forward Voltage - - 1.60 V IF = 20 mA IR Reverse Current - - 100 µA VR= 2 V λP Wavelength at Peak Emission - 935 - nm IF = 10 mA B Spectral Bandwidth between Half Power Points - 50 - nm IF = 10 mA ∆λP /∆T Spectral Shift with Temperature OP165, OP166 (A, B, C, D) OP165W, OP166W - - - ±0.30 - - nm/°C IF = Constant θHP Emission Angle at Half Power Points OP165, OP166 (A, B, C, D) OP165W, OP166W - - 18 90 - - Degree IF = 20 mA tr Output Rise Time - 1000 - ns IF(PK)=100 mA, PW=10 µs, D.C.=10.0% tf Output Fall Time - 500 - ns Notes: 1. Derate linearly 1.33 mW/°C above 25°C 2. EE(APT) is a measurement of the average apertured rediant incidence ipon a sensing area 0.081” (2.06 mm) in diameter, perpendicular to and centered on the mechanical axis of the lens, and 0.590” (14.99 mm) from the measurement surface. EE(APT) is not necessarily uniform within the measured areas. |
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