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AC857BSQ Datasheet(PDF) 2 Page - Diodes Incorporated |
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AC857BSQ Datasheet(HTML) 2 Page - Diodes Incorporated |
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2 / 5 page ![]() AC857BSQ Document number: DS39495 Rev. 1 - 2 2 of 5 www.diodes.com February 2017 © Diodes Incorporated AC857BSQ Absolute Maximum Ratings (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Value Unit Collector-Base Voltage VCBO -50 V Collector-Emitter Voltage VCEO -45 V Emitter-Base Voltage VEBO -5.0 V Collector Current IC -100 mA Peak Collector Current ICM -200 mA Peak Base Current IBM -200 mA Thermal Characteristics (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Value Unit Power Dissipation (Note 6) PD 200 mW Thermal Resistance, Junction to Ambient Air (Note 6) RJA 625 C/W Operating and Storage Temperature Range TJ, TSTG -55 to +150 C Electrical Characteristics (@TA = +25°C unless otherwise specified.) Characteristic (Note 7) Symbol Min Typ Max Unit Test Condition Collector-Base Breakdown Voltage BVCBO -50 — — V IC = -100µA, IB = 0 Collector-Emitter Breakdown Voltage BVCEO -45 — — V IC = -10mA, IB = 0 Emitter-Base Breakdown Voltage BVEBO -5 — — V IE = -100µA, IC = 0 DC Current Gain hFE 220 — 475 — VCE = -5.0V, IC = -2.0mA Collector-Emitter Saturation Voltage VCE(SAT) — — -100 -400 mV IC = -10mA, IB = -0.5mA IC = -100mA, IB = -5.0mA Base-Emitter Saturation Voltage VBE(SAT) — -700 — mV IC = -10mA, IB = -0.5mA Base-Emitter Voltage VBE(ON) -580 -665 -750 mV VCE = -5.0V, IC = -2.0mA Collector-Cutoff Current ICBO — — — — -15 -4.0 nA µA VCB = -30V VCB = -30V, TA = +150°C Emitter Cutoff Current IEBO — — -100 nA VEB = -5.0V, IC = 0 Gain Bandwidth Product fT 100 — — MHz VCE = -5.0V, IC = -10mA, f = 100MHz Collector-Base Capacitance CCBO — 2 3 pF VCB = -10V, f = 1.0MHz Emitter-Base Capacitance CEBO — 11 — pF VEB = -0.5V, f = 1.0MHz Notes: 6. For the device mounted on minimum recommended pad layout FR-4 PCB with high coverage of single sided 1oz copper, in still air conditions; the device is measured when operating in a steady-state condition. 7. Short duration pulse test used to minimize self-heating effect. |
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