High Precision Instrumentation Amplifier

AM447

analog microelectronics

April 2000

3/6

Parameter

Symbol

Conditions

RM

Min.

Typ.

Max.

Unit

Output Stage

Adjustable Gain

1.2

1.65

4

Gain Drift

5

ppm/°C

Common Mode Input Range

CMIR

0.05

V

Common Mode Rejection Ratio

CMRR

DC

80

90

dB

Power Supply Rejection Ratio

PSRR

70

80

dB

Input Offset Voltage

± 0.6

± 2.8

mV

± 15

± 25

µV/°C

Input Bias Current

yes

–5

–10

–30

nA

yes

5

10

25

pA/°C

Output Voltage Range

100

200

mV

V

Output Resistance

1

Ω

Capacitive Load Stability

047

nF

Slew Rate

SR

yes

0.027

V/

µs

Sink Capability

2

mA

Source Capability

2

mA

ESD: This integrated circuit can be damaged by ESD. Analog Microelectronics recommends that all integrated circuits

be handled with appropriate precautions. Failure to observe proper handling and installation procedures can

cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could cause the

device not to meet its published specifications.

BOUNDARY CONDITIONS

Parameter

Symbol

Conditions

Min.

Typ.

Max.

Unit

Offset Compensation Resistor (IA) 1

1)

27

33

k

Ω

Offset Compensation Resistor (IA) 2

1)

27

33

k

Ω

Gain Resistor 1

67.3

68.7

k

Ω

Gain Resistor 2

14

210

k

Ω

Offset Compensation Resistor (Bridge) 1

19

k

Ω

Offset Compensation Resistor (Bridge) 2

1

k

Ω

Set Resistor

2)

75.0

76.8

78.7

k

Ω

Sensor Bridge Resistor

3)

713

k

Ω

Differential Input Voltage

7

35

mV

Notes:

close placement of them in the circuit.