LTM4608A datasheet(4/28 Pages) LINER

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LTM4648

4648f

For more information www.linear.com/LTM4648

elecTrical characTerisTics The

denotes the specifications which apply over the full internal

operating temperature range, otherwise specifications are at TA = 25°C (Note 2). VIN = 5V per typical application.

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

GBP

Gain Bandwidth Product

MHz

CMRR

Common Mode Rejection

(Note 6)

IDIFFOUT

DIFFOUT Current

Sourcing

RIN

Input Resistance

VOSNS+ to GND

kΩ

VPGOOD

PGOOD Trip Level

VFB With Respect to Set Output

VFB Ramping Negative

VFB Ramping Positive

–10

VPGL

PGOOD Voltage Low

IPGOOD = 2mA

0.1

0.3

INTVCC Linear Regulator

VINTVCC

Internal VCC Voltage

2.375V ≤ VIN ≤ 5V

VIN = 5.5V

4.8

5.15

5.25

5.2

5.35

VINTVCC Load Reg INTVCC Load Regulation

ICC = 0mA to 50mA

0.5

Oscillator and Phase-Locked Loop

fSYNC

SYNC Capture Range

250

650

kHz

Nominal Switching Frequency

400

450

500

kHz

RMODE

Mode Input Resistance

250

kΩ

VIH_CLKIN

Clock Input Level High

2.0

VIL_CLKIN

Clock Input Level Low

0.8

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime. Notes are automatically numbered when you apply

the note style.

Note 2: The LTM4648 is tested under pulsed load conditions such that TJ ≈

TA. The LTM4648E is guaranteed to meet performance specifications over

the 0°C to 125°C internal operating temperature range. Specifications over

the –40°C to 125°C internal operating temperature range are assured by

design, characterization and correlation with statistical process controls.

The LTM4648I is guaranteed to meet specifications over the –40°C to

125°C internal operating temperature range. Note that the maximum

ambient temperature consistent with these specifications is determined by

specific operating conditions in conjunction with board layout, the rated

package thermal resistance and other environmental factors.

Note 3: The minimum on-time condition is tested at wafer sort.

Note 4: See output current derating curves for different VIN, VOUT and TA.

Note 5: Guaranteed by design.

Note 6: 100% tested at wafer level.

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