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TC93P27F Datasheet(PDF) 13 Page - Toshiba Semiconductor

Part # TC93P27F
Description  TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
PDF  16 Pages
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TC93P27F Datasheet(HTML) 13 Page - Toshiba Semiconductor

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TC93P27F
2002-11-18
13
HOLD Input Port
Characteristics
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Input leak current
ILI
¾
VIH = 3.0 V, VIL = 0 V
¾
¾
±1.0
mA
“H” level
VIH3
¾
¾
2.4
~
3.0
Input
voltage
“L” level
VIL3
¾
¾
0
~
1.2
V
A/D Converter (ADIN1 to ADIN3, DC-REF)
Characteristics
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Analog input voltage
range
VAD
¾
ADIN1 to ADIN3
0
~
VDD
V
Analog reference
voltage range
VREF
¾
DC-REF, VDD = 2.0 to 3.6 V
1.0
~
VDD
´ 0.9
V
Resolution
VRES
¾
¾
¾
6
¾
bit
Conversion total error
¾
¾
VDD = 2.0 to 3.6 V
¾
±1.0
±4.0
LSB
Analog input leak
ILI
¾
VIH = 3.0 V, VIL = 0 V
(ADIN1 to ADIN3, DC-REF)
¾
¾
±1.0
mA
Key Input Port (K0 to K3)
Characteristics
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Key input voltage
range
VKI
¾
¾
0
~
VDD
V
A/D conversion
resolution
VRES
¾
¾
¾
3
¾
bit
VDD = 1.8 to 2.0 V
¾
¾
±1.5
A/D conversion total
error
¾
¾
VDD = 2.0 to 3.6 V
¾
¾
±0.5
LSB
N-ch/P-ch input
resistance
RIN1
¾
¾
50
100
200
k
W
“H” level
VIH4
¾
When releasing WAIT instruction
1.8
~
3.0
Input
voltage
“L” level
VIL4
¾
When releasing WAIT instruction
0
~
0.3
V
Input leak current
ILI
¾
When input resistance is off,
VIH = 3.0 V, VIL = 0 V
¾
¾
±1.0
mA
DO1/OT2, DO2 Output, Mute, OT1 Output
Characteristics
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
“H” level
IOH1
¾
VOH = 2.7 V
-0.4
-0.8
¾
Output
current
“L” level
IOL1
¾
VOL = 0.3 V
0.4
0.8
¾
mA
Output off leak current
ITL
¾
VTLH = 3.0 V, VTLL = 0 V (DO1, DO2)
¾
¾
±100
nA
For conditions marked by an asterisk (*), guaranteed when VDD = 1.8 to 3.6 V, Ta = -10 to 60°C



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