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SCANSTA476 Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part # SCANSTA476
Description  Eight Input IEEE 1149.1 Analog Voltage Monitor
PDF  7 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

SCANSTA476 Datasheet(HTML) 1 Page - National Semiconductor (TI)

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SCANSTA476
Eight Input IEEE 1149.1 Analog Voltage Monitor
General Description
The SCANSTA476 is a low power, Analog Voltage Monitor
used for sampling or monitoring up to 8 analog/mixed-signal
input channels. Analog Voltage Monitors are valuable during
product development, environmental test, production, and
field service for verifying and monitoring power supply and
reference voltages. In a supervisory role, the ’STA476 is
useful for card or system-level health monitoring and prog-
nostics applications.
Instead of requiring an external microcontroller with a GPIO
interface, the ’STA476 features a common IEEE 1149.1
(JTAG) interface to select the analog input, initiate a mea-
surement, and access the results - further extending the
capabilities of an existing JTAG infrastructure.
The SCANSTA476 uses the V
REF input as a reference. This
enables the SCANSTA476 to operate with a full-scale input
range of 0 to V
DD, which can range from +2.7V to +5.5V.
The SCANSTA476 is packaged in a 16-lead non-pullback
LLP package that provides an extremely small footprint for
applications where space is a critical consideration. This
product operates over the industrial temperature range of
−40˚C to +85˚C.
Features
n
Eight selectable Analog input channels
n
Analog full-scale input range 0V to V
DD
n
Typical accuracy of 2 mV at maximum V
DD
n
Very low power operation
n
Small package footprint in 16-lead,5x5x0.8 mm LLP
n
Single +2.7V to +5.5V supply operation
n
IEEE 1149.1 (JTAG) compliant interface
Applications
n
Measurement of Point Voltages
n
Real-time Signal Monitoring
n
System Health Monitoring and Prognostics
n
Debug, Environmental Test, Production Test, Field
Service
n
Supplement In-Circuit Tester (ICT) access
n
Vital in Servers, Computing, Telecommunication and
Industrial equipment
n
Essential in Medical, Data Storage, and Networking
equipment
Block Diagram
20083521
April 2005
© 2005 National Semiconductor Corporation
DS200835
www.national.com


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