8302 Data Sheet

©2016 Integrated Device Technology, Inc

Revision D March 4, 2016

3

A

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

V

DD

Core Supply Voltage

3.135

3.3

3.465

V

V

DDO

Output Power Supply Voltage

3.135

3.3

3.465

V

I

DD

Power Supply Current

13

mA

I

DDO

Output Supply Current

4mA

A

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

V

IH

Input High Voltage

2

V

V

V

IL

Input Low Voltage

-0.3

0.8

V

I

IH

Input High Current

CLK

V

150

µA

I

IL

Input Low Current

CLK

V

-5

µA

V

OH

Output High Voltage

50

Ω to V

2.6

V

I

2.9

V

V

OL

Output Low Voltage

50

Ω to V

0.5

V

I

0.2

V

Supply Voltage, V

DD

4.6V

Inputs, V

I

-0.5V to V

Outputs, V

O

-0.5V to V

Package Thermal Impedance,

θ

JA

112.7°C/W (0 lfpm)

Storage Temperature, T

STG

-65°C to 150°C

NOTE: Stresses beyond those listed under Absolute

Maximum Ratings may cause permanent damage to the

device.These ratings are stress specifications only. Functional

operation of product at these conditions or any conditions

beyond those listed in the DC Characteristics or AC Charac-

teristics is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect product reliability.

A

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

f

MAX

Output Frequency

200

MHz

tp

LH

Propagation Delay, Low-to-High; NOTE 1

ƒ

≤ 200MHz

1.9

2.35

2.8

ns

tsk(o)

Output Skew; NOTE 2, 4

25

85

ps

tsk(pp)

Part-to-Part Skew; NOTE 3, 4

250

800

ps

t

R

Output Rise Time

20% to 80%

300

800

ps

t

F

Output Fall Time

20% to 80%

300

800

ps

odc

Output Duty Cycle

ƒ

≤ 133MHz

45

55

%

133MHz < ƒ

≤ 200MHz

40

60

%

Parameters measured at f

NOTE 1: Measured from V

NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V

NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load

conditions. Using the same type of inputs on each device, the outputs are measured at V

NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.