OP265FAC datasheet(2/3 Pages) TTELEC

2 / 3 page

General Note

TT Electronics reserves the right to make changes in product speciﬁcation without

notice or liability. All information is subject to TT Electronics’ own data and is

considered accurate at time of going to print.

Plastic Infrared Emitting Diode

OP265FAA Series

Issue F

07/2016

Page 2

OPTEK Technology, Inc.

1645 Wallace Drive, Carrollton, TX 75006|Ph: +1 972 323 2200

www.optekinc.com | www.ttelectronics.com

Absolute Maximum Ratings (TA = 25° C unless otherwise noted)

Storage and Opera ng Temperature Range

-40

o C to +100o C

Reverse Voltage

2.0 V

Con nuous Forward Current

50 mA

Peak Forward Current (1 µs pulse width, 300 pps)

3.0 A

Lead Soldering Temperature [1/16 inch (1.6 mm) from case for 5 seconds with soldering iron]

260° C

(1)

Power Dissipa on

100 mW

(2)

Electrical Speciﬁcations

Electrical Characteristics (TA = 25° C unless otherwise noted)

SYMBOL

PARAMETER

MIN

TYP

MAX

UNITS

TEST CONDITIONS

EE (APT)

Apertured Radiant Incidence

OP265FAA

OP265FAB

OP265FAC

OP265FAD

5.50

7.50

11.50

15.50

12.5

16.5

mW/cm

IF = 20 mA

Aperture = 0.081” diameter

Distance = 0.590” from sea ng surface

to aperture surface

Forward Voltage

1.80

IF = 20 mA

Reverse Current

µA

VR= 10 V

λP

Wavelength at Peak Emission

850

IF = 10 mA

∆λP /∆T

Spectral Shi with Temperature

±0.18

nm/°C

IF = Constant

θHP

Emission Angle at Half Power Points

Degree

IF = 20 mA

Output Rise Time

IF(PK)=100 mA, PW=10 µs, D.C.=10.0%

Output Fall Time

Input Diode

Notes:

1. RMA ﬂux is recommended. Dura on can be extended to 10 second maximum when ﬂow soldering. A maximum of 20 grams force may be

applied to the leads when soldering.

2. Derate linearly at 1.33 mW/° C above 25° C.

3. EE(APT) is a measurement of the average apertured radiant incidence upon a sensing area 0.081” (2.06 mm) in diameter, perpendicular to and

centered on the mechanical axis of the lens and 0.590” (14.99 mm) from the measurement surface. EE(APT) is not necessarily uniform within the

measured area.

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