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ACE809N Datasheet(PDF) 1 Page - ACE Technology Co., LTD. |
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ACE809N Datasheet(HTML) 1 Page - ACE Technology Co., LTD. |
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1 / 8 page ![]() ACE803N/ACE809N/ACE810N Ultra Low Power Microprocessor Reset IC VER 1.2 1 Description The ACE803N/ACE809N/ACE810N series are micro- processor (μP) supervisory circuits used to monitor the power supplies in μP and digital systems. They provide excellent circuit reliability and low cost by eliminating external components. These circuits perform a single function: they assert a reset signal whenever the VCC supply voltage declines below a preset threshold, keeping it asserted for at least 140ms after VCC has risen above the reset threshold. The ACE809N/810N have CMOS outputs, The ACE803N has open drain output. The ACE803N/809N have an active-low RESET output, while the ACE810N has an active-high RESET output. The reset comparator is designed to ignore fast transients on VCC, and the outputs are guaranteed to be in the correct logic state for VCC down to 1.15V over the temperature range. Features Precise Reset Threshold: ±2.5% CMOS Output(ACE809N/810N) and Open Drain Output(ACE803N) 140ms min Reset Pulse Width 3.2μA Supply Current @V CC=3V Guaranteed Reset Valid to V CC = +1.15V Power Supply Transient Immunity Operating Temperature Range: -40°C to +85°C Application Computers Portable/Battery-Powered Equipment Intelligent Instruments Controllers Absolute Maximum Ratings Parameter Symbol Max Unit Terminal Voltage (With respect to GND) VCC -0.3~6 V RESET, RESET Input / Output Current VCC 20 mA RESET, RESET Thermal resistance θ JA 300 ℃/W Operating Temperature TA -40~85 ℃ ESD Rating (HBM) 4 KV Storage Temperature TS -60 to 150 ℃ Note: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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