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ACE809N Datasheet(PDF) 1 Page - ACE Technology Co., LTD.

Part # ACE809N
Description  Ultra Low Power Microprocessor Reset IC
PDF  8 Pages
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Manufacturer  ACE [ACE Technology Co., LTD.]
Direct Link  http://www.ace-ele.com
Logo ACE - ACE Technology Co., LTD.

ACE809N Datasheet(HTML) 1 Page - ACE Technology Co., LTD.

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ACE803N/ACE809N/ACE810N
Ultra Low Power Microprocessor Reset IC
VER 1.2
1
Description
The ACE803N/ACE809N/ACE810N series are micro- processor
(μP) supervisory circuits used to
monitor the
power supplies in μP and digital systems. They provide excellent circuit reliability and low cost
by eliminating external components.
These circuits perform a single function: they assert a reset signal whenever the VCC supply voltage
declines below a preset threshold, keeping it asserted for at least 140ms after VCC has risen above the
reset threshold.
The ACE809N/810N have CMOS outputs, The ACE803N has open drain output. The ACE803N/809N
have an active-low RESET output, while the ACE810N has an active-high RESET output. The reset
comparator is designed to ignore fast transients on VCC, and the outputs are guaranteed to be in the
correct logic state for VCC down to 1.15V over the temperature range.
Features
Precise Reset Threshold: ±2.5%
CMOS Output(ACE809N/810N) and Open Drain Output(ACE803N)
140ms min Reset Pulse Width
3.2μA Supply Current @V
CC=3V
Guaranteed Reset Valid to V
CC = +1.15V
Power Supply Transient Immunity
Operating Temperature Range: -40°C to +85°C
Application
Computers
Portable/Battery-Powered Equipment
Intelligent Instruments
Controllers
Absolute Maximum Ratings
Parameter
Symbol
Max
Unit
Terminal Voltage (With respect to GND)
VCC
-0.3~6
V
RESET, RESET
Input / Output Current
VCC
20
mA
RESET, RESET
Thermal resistance
θ
JA
300
℃/W
Operating Temperature
TA
-40~85
ESD Rating (HBM)
4
KV
Storage Temperature
TS
-60 to 150 ℃
Note:
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.


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