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71321LA55TFG Datasheet(PDF) 7 Page - Integrated Device Technology

Part # 71321LA55TFG
Description  HIGH SPEED 2K X 8 DUAL-PORT STATIC RAM
PDF  18 Pages
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

71321LA55TFG Datasheet(HTML) 7 Page - Integrated Device Technology

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6.42
IDT71321SA/LA and IDT71421SA/LA
High Speed 2K x 8 Dual-Port Static RAM with Interrupts
Industrial and Commercial Temperature Ranges
7
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage Output Test Load (Figure 2).
2. 'X' in part numbers indicates power rating (SA or LA).
3. This parameter is guaranteed by device characterization, but is not production tested.
AC Ele c t ric a l Cha ra c t e rist ic s Ove r t he
Ope rat ing Te m pe ra t ure Supply Volt a ge Ra nge (2)
71321X20
71421X20
Com'l Only
71321X25
71421X25
Com'l
& Ind
Unit
Symbol
Parameter
Min.Max.Min.Max.
READ CYCLE
tRC
Read Cycle Time
20
____
25
____
ns
tAA
Address Access Time
____
20
____
25
ns
tACE
Chip Enable Access Time
____
20
____
25
ns
tAOE
Output Enable Access Time
____
11
____
12
ns
tOH
Output Hold from Address Change
3
____
3
____
ns
tLZ
Output Low-Z Time(1,3)
0
____
0
____
ns
tHZ
Output High-Z Time(1,3)
____
10
____
10
ns
tPU
Chip Enable to Power Up Time (3)
0
____
0
____
ns
tPD
Chip Disable to Power Down Time(3)
____
20
____
25
ns
2691 tbl 08a
71321X35
71421X35
Com'l Only
71321X55
71421X55
Com'l
& Ind
Unit
Symbol
Parameter
Min.Max.Min.Max.
READ CYCLE
tRC
Read Cycle Time
35
____
55
____
ns
tAA
Address Access Time
____
35
____
55
ns
tACE
Chip Enable Access Time
____
35
____
55
ns
tAOE
Output Enable Access Time
____
20
____
25
ns
tOH
Output Hold from Address Change
3
____
3
____
ns
tLZ
Output Low-Z Time(1,3)
0
____
5
____
ns
tHZ
Output High-Z Time(1,3)
____
15
____
25
ns
tPU
Chip Enable to Power Up Time(3)
0
____
0
____
ns
tPD
Chip Disable to Power Down Time(3)
____
35
____
50
ns
2691 tbl 08b



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