2 / 7 page
7c147: 12/4/89
Revision: Thursday, November 11, 1993
CY7C147
2
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines,
not tested.)
Storage Temperature
-65
_C to +150_C
..................
Ambient Temperature with
Power Applied
-55
_C to +125_C
.......................
Supply Voltage to Ground Potential
(Pin 18 to Pin 9)
-0.5V to +7.0V
........................
DC Voltage Applied to Outputs
in High Z State
-0.5V to +7.0V
.........................
DC Input Voltage
-3.0V to +7.0V
.......................
Output Current into Outputs (LOW)
20 mA
..............
Static Discharge Voltage
>2001V
........................
(per MIL STD 883, Method 3015)
LatchUp Current
>200 mA
...........................
Operating Range
Range
Ambient
Temperature
VCC
Commercial
0
_C to +70_C
5V ± 10%
Military[1]
-55
_C to +125_C
5V ± 10%
Electrical Characteristics Over the Operating Range[2]
7C147-25
7C147-35, 45
Parameter
Description
Test Conditions
Min.
Max.
Min.
Max.
Unit
VOH
Output High Voltage
VCC = Min., IOH = -4.0 mA
2.4
2.4
V
VOL
Output Low Voltage
VCC = Min., IOL = 12.0 mA
0.4
0.4
V
VIH
Input High Voltage
2.0
6.0
2.0
6.0
V
VIL
Input Low Voltage
-3.0
0.8
-3.0
0.8
V
IIX
Input Load Current
GND < VI < VCC
-10
+10
-10
+10
mA
IOZ
Output Leakage
Current
GND < VO < VCC
Output Disabled
-50
+50
-50
+50
mA
IOS
Output Short
Circuit Current[3]
VCC = Max., VOUT = GND
-350
-350
mA
ICC
VCC Operating
Sl C
t
VCC = Max.,
I
0A
Com'l
90
80
mA
CC
pg
Supply Current
CC =
,
IOUT =0mA
Mil
110
ISB
Automatic CE[4]
PD
C
t
Max. VCC,
CE
V
Com'l
15
10
mA
PowerDown Current
CC,
CE > VIH
Mil
10
Capacitance[5]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA =25_C,f=1 MHz,
5
8
pF
COUT
Output Capacitance
TA 25 C, f 1 MHz,
VCC = 5.0V
8
pF
Notes:
1. TA is the "instant on" case temperature.
2. See the last page of this specification for Group A subgroup testing
information.
3. Duration of the short circuit should not exceed 30 seconds.
4. A pullup resistor to VCC on the CE input is required to keep the de
vice deselected during VCC power up, otherwise ISB will exceed values
given.
5. Tested initially and after any design or process changes that may af
fect these parameters.
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
