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SSM6K217FE Datasheet(PDF) 3 Page - Toshiba Semiconductor |
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SSM6K217FE Datasheet(HTML) 3 Page - Toshiba Semiconductor |
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3 / 9 page ![]() SSM6K217FE 3 5. 5. 5. 5. Electrical Characteristics Electrical Characteristics Electrical Characteristics Electrical Characteristics 5.1. 5.1. 5.1. 5.1. Static Characteristics (Unless otherwise specified, T Static Characteristics (Unless otherwise specified, T Static Characteristics (Unless otherwise specified, T Static Characteristics (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Drain-source breakdown voltage Drain-source breakdown voltage Drain cut-off current Gate leakage current Gate threshold voltage Drain-source on-resistance Forward transfer admittance (Note 1) (Note 2) (Note 2) Symbol V(BR)DSS V(BR)DSX IDSS IGSS Vth RDS(ON) |Yfs| Test Condition ID = 1 mA, VGS = 0 V ID = 1 mA, VGS = -12 V VDS = 40 V, VGS = 0 V VDS = 0 V, VGS = ±10 V VDS = 3 V, ID = 1 mA ID = 1.0 A, VGS = 8.0 V ID = 1.0 A, VGS = 4.5 V ID = 1.0 A, VGS = 4.2 V ID = 1.0 A, VGS = 3.6 V ID = 0.5 A, VGS = 2.5 V ID = 0.2 A, VGS = 1.8 V VDS = 3 V, ID = 0.2 A Min 40 25 0.5 Typ. 155 165 166 170 190 230 2 Max 1 ±10 1.2 195 208 211 218 248 400 Unit V µA V mΩ S Note 1: Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (1 mA for this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON). Take this into consideration when using the device. Note 2: Pulse measurement. 5.2. 5.2. 5.2. 5.2. Dynamic Characteristics (Unless otherwise specified, T Dynamic Characteristics (Unless otherwise specified, T Dynamic Characteristics (Unless otherwise specified, T Dynamic Characteristics (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Input capacitance Reverse transfer capacitance Output capacitance Switching time (turn-on time) Switching time (turn-off time) Symbol Ciss Crss Coss ton toff Test Condition VDS = 10 V, VGS = 0 V, f = 1 MHz VDS = 10 V, ID = 0.5 A, VGS = 0 to 2.5 V, RG = 4.7 Ω Min Typ. 130 7.5 26 13 8 Max Unit pF ns 5.3. 5.3. 5.3. 5.3. Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Fig. Fig. Fig. Fig. 5.3.1 5.3.1 5.3.1 5.3.1 Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Fig. Fig. Fig. Fig. 5.3.2 5.3.2 5.3.2 5.3.2 Input Waveform/Output Waveform Input Waveform/Output Waveform Input Waveform/Output Waveform Input Waveform/Output Waveform 5.4. 5.4. 5.4. 5.4. Gate Charge Characteristics (Unless otherwise specified, T Gate Charge Characteristics (Unless otherwise specified, T Gate Charge Characteristics (Unless otherwise specified, T Gate Charge Characteristics (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Total gate charge (gate-source plus gate-drain) Gate-source charge 1 Gate-drain charge Symbol Qg Qgs1 Qgd Test Condition VDS = 10 V, ID = 1.8 A, VGS = 4.2 V Min Typ. 1.1 0.18 0.5 Max Unit nC 2014-03-12 Rev.1.0 |
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