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MPC5748C Datasheet(PDF) 21 Page - NXP Semiconductors

Part # MPC5748C
Description  MPC5748G Microcontroller
PDF  76 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

MPC5748C Datasheet(HTML) 21 Page - NXP Semiconductors

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Table 12. STANDBY Current consumption characteristics
Symbol
Parameter
Conditions1
Min
Typ
Max
Unit
STANDBY0
STANDBY with
8K RAM
Ta = 25 °C
—
71
—
µA
Ta = 85 °C
—
175
800
Ta = 105 °C
—
338
1725
Ta = 125 °C
—
750
2775
STANDBY1
STANDBY with
64K RAM
Ta = 25 °C
—
72
—
µA
Ta = 85 °C
—
176
815
Ta = 105 °C
—
350
1775
Ta = 125 °C
—
825
3000
STANDBY2
STANDBY with
128K RAM
Ta = 25 °C
—
75
—
µA
Ta = 85 °C
—
182
830
Ta = 105 °C
—
366
1825
Ta = 125 °C
—
900
3250
STANDBY3
STANDBY with
256K RAM
Ta = 25 °C
—
80
—
µA
Ta = 85 °C
—
197
860
Ta = 105 °C
—
400
1875
Ta = 125 °C
—
975
3500
STANDBY3
FIRC ON
Ta = 25 °C
—
500
—
µA
1. The content of the Conditions column identifies the components that draw the specific current.
NOTE
For the Precision channel Analog inputs, SIUL2_MSCRn[PUS]
must be configured to 0 before entering STANDBY. An
increase in current would be observed when
SIUL2_MSCRn[PUS] is configured to be 1, irrespective of the
state of IBE or PUE. The current numbers would increase
irrespective of whether the pad is pulled low/high externally.
4.6 Electrostatic discharge (ESD) characteristics
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n + 1) supply pin). This
test conforms to the AEC-Q100-002/-003/-011 standard.
NOTE
A device will be defined as a failure if after exposure to ESD
pulses the device no longer meets the device specification
requirements. Complete DC parametric and functional testing
shall be performed per applicable device specification at room
General
MPC5748G Microcontroller Data Sheet, Rev. 6, 11/2018
NXP Semiconductors
21



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