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MPC5748C Datasheet(PDF) 21 Page - NXP Semiconductors |
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MPC5748C Datasheet(HTML) 21 Page - NXP Semiconductors |
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21 / 76 page ![]() Table 12. STANDBY Current consumption characteristics Symbol Parameter Conditions1 Min Typ Max Unit STANDBY0 STANDBY with 8K RAM Ta = 25 °C — 71 — µA Ta = 85 °C — 175 800 Ta = 105 °C — 338 1725 Ta = 125 °C — 750 2775 STANDBY1 STANDBY with 64K RAM Ta = 25 °C — 72 — µA Ta = 85 °C — 176 815 Ta = 105 °C — 350 1775 Ta = 125 °C — 825 3000 STANDBY2 STANDBY with 128K RAM Ta = 25 °C — 75 — µA Ta = 85 °C — 182 830 Ta = 105 °C — 366 1825 Ta = 125 °C — 900 3250 STANDBY3 STANDBY with 256K RAM Ta = 25 °C — 80 — µA Ta = 85 °C — 197 860 Ta = 105 °C — 400 1875 Ta = 125 °C — 975 3500 STANDBY3 FIRC ON Ta = 25 °C — 500 — µA 1. The content of the Conditions column identifies the components that draw the specific current. NOTE For the Precision channel Analog inputs, SIUL2_MSCRn[PUS] must be configured to 0 before entering STANDBY. An increase in current would be observed when SIUL2_MSCRn[PUS] is configured to be 1, irrespective of the state of IBE or PUE. The current numbers would increase irrespective of whether the pad is pulled low/high externally. 4.6 Electrostatic discharge (ESD) characteristics Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts × (n + 1) supply pin). This test conforms to the AEC-Q100-002/-003/-011 standard. NOTE A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification requirements. Complete DC parametric and functional testing shall be performed per applicable device specification at room General MPC5748G Microcontroller Data Sheet, Rev. 6, 11/2018 NXP Semiconductors 21 |
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