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MJF15030 Datasheet(PDF) 2 Page - ON Semiconductor

Part # MJF15030
Description  COMPLEMENTARY SILICON POWER TRANSISTORS
PDF  6 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MJF15030 Datasheet(HTML) 2 Page - ON Semiconductor

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MJF15030 MJF15031
2
Motorola Bipolar Power Transistor Device Data
ELECTRICAL CHARACTERISTICS (TC = 25_C unless otherwise noted)
Characteristic
Symbol
Min
Max
Unit
OFF CHARACTERISTICS
Collector–Emitter Sustaining Voltage (1) (IC = 10 mAdc, IB = 0)
VCEO(sus)
150
—
Vdc
Collector Cutoff Current (VCE = 150 Vdc, IB = 0)
ICEO
—
10
µAdc
Collector Cutoff Current (VCB = 150 Vdc, IE = 0)
ICBO
—
10
µAdc
Emitter Cutoff Current (VBE = 5 Vdc, IC = 0)
IEBO
—
10
µAdc
ON CHARACTERISTICS (1)
DC Current Gain (IC = 0.1 Adc, VCE = 2 Vdc)
(IC = 2 Adc, VCE = 2 Vdc)
(IC = 3 Adc, VCE = 2 Vdc)
(IC = 4 Adc, VCE = 2 Vdc)
hFE
40
40
40
20
—
—
—
—
—
Typ
DC Current Gain Linearity
(VCE from 2 V to 20 V, IC from 0.1 A to 3 A) (NPN to PNP)
hFE
2
3
(VCE from 2 V to 20 V, IC from 0.1 A to 3 A) (NPN to PNP)
FE
3
Collector–Emitter Saturation Voltage (IC = 1 Adc, IB = 0.1 Adc)
VCE(sat)
—
0.5
Vdc
Base–Emitter On Voltage (IC = 1 Adc, VCE = 2 Vdc)
VBE(on)
—
1
Vdc
DYNAMIC CHARACTERISTICS
Current Gain–Bandwidth Product (2) (IC = 500 mAdc, VCE = 10 Vdc, ftest = 10 MHz)
fT
30
—
MHz
NOTES:
1. Pulse Test: Pulse Width
v 300 µs, Duty Cycle v 2%.
2. fT = hfe• ftest.
t, TIME (ms)
1
0.01
0.3
0.2
0.1
0.05
0.02
0.5
10
30
50
100
300
500
1K
3K
5K
SINGLE PULSE
R
θJC(t) = r(t) RθJC
TJ(pk) – TC = P(pk) R
θJC(t)
1
5
3
10K
0.5
0.3
0.03
0.1
0.2
20
200
2K
2
Figure 1. Thermal Response
Figure 2. Forward Bias Safe Operating Area
100
µs
5 ms
dc
20
3
VCE, COLLECTOR–EMITTER VOLTAGE (VOLTS)
5
200
5
3
10
2
0.1
0.03
WIREBOND LIMIT
THERMAL LIMIT
SECONDARY BREAKDOWN
LIMIT @ TC = 25°C
10
30
50
70
1
0.02
100
2
7
20
0.05
0.2
0.3
0.5
150
There are two limitations on the power handling ability of a
transistor: average junction temperature and second break-
down. Safe operating area curves indicate IC – VCE limits of
the transistor that must be observed for reliable operation,
i.e., the transistor must not be subjected to greater dissipa-
tion than the curves indicate.
The data of Figures 2 and 3 is based on TJ(pk) = 150_C;
TC is variable depending on conditions. Second breakdown
pulse limits are valid for duty cycles to 10% provided TJ(pk)
< 150
_C. TJ(pk) may be calculated from the data in Figure 1.
At high case temperatures, thermal limitations will reduce the
power that can be handled to values less than the limitations
imposed by second breakdown.



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