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TPS25980X Datasheet(PDF) 23 Page - Texas Instruments

Part # TPS25980X
Description  TPS25980: 2.7- 24 V, 8 A, 3 m廓 Smart eFuse - Integrated Hot-swap Protection With Adjustable Transient Fault Management
PDF  55 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TPS25980X Datasheet(HTML) 23 Page - Texas Instruments

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IMON
IMON
OUT
IMON
V
V
G
A / A
I
A
R
P
u
u
:
(6)
It is recommended to limit the maximum IMON voltage to the values mentioned in VIMON(Max) Recommended
Values . This is to ensure the IMON pin internal amplifier has sufficient headroom to operate linearly.
Table 8-2. VIMON(MAX) Recommended Values
VIN
Recommended VIMON(MAX)
2.7 V
1 V
3.3 V
1.8 V
> 5 V
3.3 V
It is recommended to add a RC low pass filter on the IMON output to filter out any glitches and get a smooth
average current measurement. TI recommends a series resistance of 10 kΩ or higher.
8.3.6 Power Good (PG)
PG is an active high open drain output which indicates whether the FET is fully turned ON and the output voltage
has reached the maximum value. After power-up, PG is pulled low initially. The gate driver circuit starts charging
the gate capacitance from the internal charge pump. When the FET gate voltage reaches (VIN + 3.6V), PG is
asserted after a de-glitch time (tPGD). During normal operation, if at any time VOUT falls below (VIN - VPGTHD), PG
is de-asserted after a de-glitch time (tPGD).
IN
0
Time
OUT
0
PG
VPG
0
VGate
VIN + 3.6V
0
EN/UVLO
VUVLO(R)
0
Slew rate (dVdt) controlled
startup/Inrush current limiting
VIN
Overcurrent Event
Overcurrent Removed
ILIM
IINRUSH
0
120 µs
tITIMER
IOUT
Current limiting
operation
120 µs
120 µs
0
VIN
dVdT
Device Enabled
VPGTHD
Figure 8-5. Power Good Assertion and De-assertion
www.ti.com
TPS25980
SLVSFR1 – AUGUST 2020
Copyright © 2020 Texas Instruments Incorporated
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Product Folder Links: TPS25980



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