AS7C33256PFD18B

®

1/31/05; v.1.2

Alliance Semiconductor

P. 16 of 19

AC test conditions

50

Ω

Figure B: Output load (A)

30 pF*

Figure A: Input waveform

10%

90%

GND

90%

10%

+3.0V

• Input pulse level: GND to 3V. See Figure A.

• Input rise and fall time (measured at 0.3V and 2.7V): 2 ns. See Figure A.

• Input and output timing reference levels: 1.5V.

for 3.3V I/O;

for 2.5V I/O

353

Ω / 1538Ω

5 pF*

319

Ω / 1667Ω

GND

Figure C: Output load (B)

*including scope

and jig capacitance

Thevenin equivalent:

+3.3V for 3.3V I/O;

/+2.5V for 2.5V I/O

Notes

1

For test conditions, see AC Test Conditions, Figures A, B, C.

2

This parameter measured with output load condition in Figure C.

3

This parameter is sampled, but not 100% tested.

5

tCH measured as HIGH above VIH and tCL measured as LOW below VIL.

6

This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK. All other synchronous inputs

must meet the setup and hold times for all rising edges of CLK when chip is enabled.

7

8