ZSSC3123AI2T datasheet(32/67 Pages) RENESAS

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ZSSC3123 Datasheet

August 16, 2018

10.4 Status and Diagnostics

Status bits (the two MSBs of the fetched high data byte; see Table 16) are provided in I2C and SPI but not in PDM. The status bits are used to

indicate the current state of the fetched data. Diagnostic detection is available in I2C, SPI, and PDM. In I2C and SPI diagnostics are reported

as a saturated high capacitance and temperature output (see Table 16). In PDM, diagnostics are reported as a railed high output level for both

PDM_C (capacitive PDM) and PDM_T (temperature PDM). If a diagnostic value is reported then one or more of the errors shown in Table 18

occurred in normal operation.

Configuration EEPROM diagnostics are detected at initial power-up of the ZSSC3123 or a wakeup in Sleep Mode and are permanent

diagnostics. All other diagnostics are detected during a measurement cycle and reported in the subsequent data fetch for I2C or SPI or in an

output register update for PDM.

Table 16. Status Bit Definitions

Status Bits (I2C or SPI)

PDM Output

Definition

00BIN

Clipped normal output

Valid data: Data that has not been fetched since the last

measurement cycle.

01BIN

Not applicable

Stale data: Data that has already been fetched since the last

measurement cycle.

Note: If a data fetch is performed before or during the first

measurement after power-on reset, then “Stale data” will be

returned, but this data is actually invalid since the first

measurement has not been completed.

10BIN

Not applicable

Command Mode: The ZSSC3123 is in Command Mode.

11BIN

Not used

Table 17. Diagnostic Detection

I2C or SPI Output

PDM Output

Definition

Saturated output 3FFFHEX

High output (railed) level

A diagnostic fault has occurred in normal operation (see the

following table).

Table 18. Normal Operation Diagnostic Table

Diagnostic

Type

Definition

Configuration Error

Permanent

An EEPROM or RAM parity error occurred in the initial

loading of the configuration registers.

RAM Parity Error

Transient

A RAM parity error occurred during a microcontroller

instruction in the last measurement cycle.

EEPROM Error

Transient

A double-bit error detection (DED) EEPROM error occurred

in the last measurement cycle (see section 10.4.1).

Math Warning

Transient

An internal math overflow has occurred in the last

measurement cycle and the output might be invalid.

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