FODM352V datasheet(2/8 Pages) ONSEMI

2 / 8 page

FODM352

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Table 1. SAFETY AND INSULATIONS RATING As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical

insulation” only within the safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.

Parameter

Characteristics

Installation Classifications per DIN VDE 0110/1.89 Table 1, For Rated

Mains Voltage

< 150 VRMS

I–IV

< 300 VRMS

I–III

Climatic Classification

55/110/21

Pollution Degree (DIN VDE 0110/1.89)

Comparative Tracking Index

175

Symbol

Parameter

Value

Unit

VPR

Input−to−Output Test Voltage, Method A, VIORM x 1.6 = VPR, Type and Sample

Test with tm = 10 s, Partial Discharge < 5 pC

904

Vpeak

Input−to−Output Test Voltage, Method B, VIORM x 1.875 = VPR, 100% Produc-

tion Test with tm = 1 s, Partial Discharge < 5 pC

1060

Vpeak

VIORM

Maximum Working Insulation Voltage

565

Vpeak

VIOTM

Highest Allowable Over−Voltage

6,000

Vpeak

External Creepage

w 5

External Clearance

w 5

DTI

Distance Through Insulation (Insulation Thickness)

w 0.4

Case Temperature (Note 1)

150

°C

IS,INPUT

Input Current (Note 1)

200

PS,OUTPUT

Output Power (Note 1)

300

RIO

Insulation Resistance at TS, VIO = 500 V (Note 1)

> 109

1. Safety limit values – maximum values allowed in the event of a failure.

Table 2. ABSOLUTE MAXIMUM RATINGS (Note 2) TA = 25°C unless otherwise specified.

Symbol

Parameter

Value

Units

TSTG

Storage Temperature

−55 to +150

°C

TOPR

Operating Temperature

−55 to +110

°C

Junction Temperature

−55 to +125

°C

TSOL

Lead Solder Temperature (Refer to Reflow Temperature Profile)

260 for 10 sec

°C

EMITTER

IF(average)

Continuous Forward Current

Reverse Input Voltage

PDLED

Power Dissipation (Note 3)

DETECTOR

IC(average)

Continuous Collector Current

150

VCEO

Collector−Emitter Voltage

300

VECO

Emitter−Collector Voltage

0.1

PDC

Collector Power Dissipation (Note 3)

150

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

2. Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device

functionality should not be assumed, damage may occur and reliability may be affected.

3. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected to conditions outside

these ratings.

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