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PJD45P03 Datasheet(PDF) 2 Page - Pan Jit International Inc.

Part # PJD45P03
Description  30V P-Channel Enhancement Mode MOSFET
PDF  8 Pages
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Manufacturer  PANJIT [Pan Jit International Inc.]
Direct Link  http://www.panjit.com.tw
Logo PANJIT - Pan Jit International Inc.

PJD45P03 Datasheet(HTML) 2 Page - Pan Jit International Inc.

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PPJD45P03
April 5,2017-REV.00
Page 2
Electrical Characteristics (TA=25
o
C unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITION
MIN.
TYP.
MAX.
UNITS
Static
Drain-Source Breakdown Voltage
BVDSS
VGS=0V,ID=-250uA
-30
-
-
V
Gate Threshold Voltage
VGS(th)
VDS=VGS,ID=-250uA
-1.0
-1.6
-2.5
Drain-Source On-State Resistance
RDS(on)
VGS=-10V,ID=-10A
-
12
15.5
m
Ω
VGS=-4.5V,ID=-6A
-
18
23
Zero Gate Voltage Drain Current
IDSS
VDS=-30V,VGS=0V
-
-
-1.0
uA
Gate-Source Leakage Current
IGSS
VGS=+20V,VDS=0V
-
-
+100
nA
Dynamic
(Note 6)
Total Gate Charge
Qg
VDS=-15V, ID=-8A,
VGS=-4.5V
(Note 1,2)
-
14
-
nC
Gate-Source Charge
Qgs
-
4.6
-
Gate-Drain Charge
Qgd
-
5.4
-
Input Capacitance
Ciss
VDS=-15V, VGS=0V,
f=1.0MHZ
-
1556
-
pF
Output Capacitance
Coss
-
243
-
Reverse Transfer Capacitance
Crss
-
175
-
Turn-On Delay Time
td(on)
VDD=-15V, ID=-1A,
VGS=-10V, RG=6Ω
(Note 1,2)
-
7.3
-
ns
Turn-On Rise Time
tr
-
13
-
Turn-Off Delay Time
td(off)
-
88
-
Turn-Off Fall Time
tf
-
48
-
Drain-Source Diode
Maximum Continuous Drain-Source
Diode Forward Current
IS
---
-
-
-45
A
Diode Forward Voltage
VSD
IS=-1A,VGS=0V
-
-0.7
-1.0
V
NOTES :
1.
Pulse width<300us, Duty cycle<2%
2.
Essentially independent of operating temperature typical characteristics
3.
Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and
duty cycles to keep initial TJ =25°C.
4.
The maximum current rating is package limited
5.
RJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is
defined as the solder mounting surface of the drain pins. Mounted on a 1 inch
2 with 2oz.square pad of copper
6.
Guaranteed by design, not subject to production testing.



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