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74F125 Datasheet(PDF) 4 Page - NXP Semiconductors |
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74F125 Datasheet(HTML) 4 Page - NXP Semiconductors |
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4 / 10 page  Philips Semiconductors Product specification 74F125, 74F126 Quad buffers (3-State) March 28, 1989 4 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –15 mA IOL Low-level output current 64 mA Tamb Operating free air temperature range 0 +70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT IO = 3mA ±10%VCC 2.4 V VO High level output voltage VCC = MIN, VIL = MAX IOH=–3mA ±5%VCC 2.7 3.3 V VOH High-level output voltage VIL = MAX, VIH = MIN IO = 15mA ±10%VCC 2.0 V IOH=–15mA ±5%VCC 2.0 V VO Low level output voltage VCC = MIN, VIL = MAX IO = MAX ±10%VCC 0.55 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOH= MAX ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –20 µA IOZH Off-state output current, High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short circuit output current3 VCC = MAX –100 –225 mA ICCH OEn = GND, Dn = 4.5V 17 24 mA 74F125 ICCL VCC = MAX OEn = Dn = GND 28 40 mA ICC Supply current (total) ICCZ OEn = Dn = 4.5V 25 35 mA ICC Supply current (total) ICCH OEn = Dn = 4.5V 20 30 mA 74F126 ICCL VCC = MAX OEn = 4.5V, Dn = GND 32 48 mA ICCZ OEn = GND, Dn = 4.5V 26 39 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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