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AP22653Q Datasheet(PDF) 3 Page - Diodes Incorporated

Part # AP22653Q
Description  PRECISON-ADJUSTABLE CURRENT-LIMITED AUTOMOTIVE-COMPLIANT POWER SWITCH
PDF  13 Pages
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Manufacturer  DIODES [Diodes Incorporated]
Direct Link  http://www.diodes.com
Logo DIODES - Diodes Incorporated

AP22653Q Datasheet(HTML) 3 Page - Diodes Incorporated

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AP22653Q
Document number: DS42760 Rev. 4 - 2
3 of 13
www.diodes.com
September 2021
© Diodes Incorporated
AP22653Q
Absolute Maximum Ratings (@ TA = +25°C, unless otherwise specified.)
Symbol
Parameter
Ratings
Unit
ESD
HBM
Human Body Model ESD Protection, per AEC Q100-002(7)
2
kV
CDM
Charged Device Model ESD Protection, per AEC Q100-011
750
V
IEC System
Level
Surges per IEC61000-4-2. 1999 Applied to Output
Terminals of EVM (Note 6)
16
kV
VIN, VOUT, VFAULT ,
VILIM, EN
V
Voltage on IN, OUT, FAULT , ILIM, EN
-0.3 to +6.0
V
—
Continuous FAULT Sink Current
25
mA
—
ILIM Source Current
1
mA
ILOAD
Maximum Continuous Load Current
Internal Limited
A
TJ(MAX)
Maximum Junction Temperature
-40 to +150
°C
TSTG
Storage Temperature Range (Note 5)
-65 to +150
°C
RΘJA
Thermal Resistance, Junction to Ambient (Note 8) SOT26
120
°C/W
RΘJC
Thermal Resistance, Junction to Case (Note 8)
SOT26
35
°C/W
Notes:
5. UL Recognized Rating from -30°C to +70°C (Diodes Incorporated qualified TSTG from -65°C to +150°C).
6. External capacitors need to be connected to the output, EVM board was tested with external capacitor. This level is a pass test only and not a
limit.
7. AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
8. The JEDEC high-K (2s2p) board used to derive this data was a 3inch x 3inch, multilayer board with 1oz internal power and ground planes with
2oz copper traces on top and bottom of the board.
Caution:
Stresses greater than the 'Absolute Maximum Ratings' specified above, can cause permanent damage to the device. These are stress ratings only;
functional operation of the device at these or any other conditions exceeding those indicated in this specification is not implied. Device reliability can be
affected by exposure to absolute maximum rating conditions for extended periods of time.
Semiconductor devices are ESD sensitive and can be damaged by exposure to ESD events. Suitable ESD precautions should be taken when
handling and transporting these devices.
Recommended Operating Conditions (@ TA = +25°C, unless otherwise specified.)
Symbol
Parameter
Min
Max
Unit
VIN
Input Voltage
3
5.5
V
IOUT
Continuous Output Current (-40°C ≤ TJ ≤ +105°C)
0
1.5
A
Continuous Output Current (-40°C ≤ TJ ≤ +125°C)
0
1.2
A
EN
V
Enable Voltage
0
5.5
V
VIH
High-Level Input Voltage on EN
1.5
VIN
V
VIL
Low-Level Input Voltage on EN
0
0.4
V
RLIM
Current-Limit Threshold Resistor Range
(1% Initial Tolerance)
15
210
kΩ
IO
Continuous FAULT Sink Current
0
10
mA
—
Input De-Coupling Capacitance, IN to GND
0.1
—
µF
TJ
Operating Junction Temperature IOUT
≤ 1.5 A
-40
+105
°C
Operating Junction Temperature IOUT
≤ 1.2 A
-40
+125
°C



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