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74F244 Datasheet(PDF) 5 Page - NXP Semiconductors |
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74F244 Datasheet(HTML) 5 Page - NXP Semiconductors |
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5 / 12 page ![]() Philips Semiconductors Product specification 74F244/74F244B Octal buffers (3-State) 1994 Dec 5 5 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST LIMITS UNIT SYMBOL PARAMETER CONDITIONS1 MIN TYP2 MAX UNIT VCC = MIN, IOH = -3mA ±10%VCC 2.5 V VOH High-level output voltage VIL = MAX, ±5%VCC 2.7 3.4 V VIH = MIN IOH = -15mA ±10%VCC 2.0 V ±5%VCC 2.0 V VOL Low-level output voltage VCC = MIN, VIL = MAX, IOL = MAX ±10%VCC 0.55 V VIH = MIN, ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK -0.73 -1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA 74F244 OEa, OEb -1.0 mA IIL Low-level input current 74F244 Ian, Ibn VCC = MAX, VI = 0.5V -1.6 mA 74F244B all inputs -40 µA IOZH Off-state output current, high-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state output current, low-level voltage applied VCC = MAX, VO = 0.5V -50 µA IOS Short-circuit output current3 VCC = MAX -100 -225 mA ICCH 40 60 mA 74F244 ICCL VCC = MAX 60 90 mA ICC Supply current (total) ICCZ 60 90 mA ICCH 20 30 mA 74F244B ICCL VCC = MAX 50 70 mA ICCZ 29 40 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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