 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
N74F245DB Datasheet(PDF) 4 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
N74F245DB Datasheet(HTML) 4 Page - NXP Semiconductors |
|
|
4 / 10 page  Philips Semiconductors Product specification 74F245 Octal transceiver (3-State) November 15, 1994 4 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT A0 A7 B0 B7 IO = 3mA ±10% VCC 2.4 V VO High level output voltage A0–A7, B0–B7 VCC = MIN, VIL = MAX IOH = –3mA ±5% VCC 2.7 3.4 V VOH High-level output voltage B0 B7 VIL = MAX, VIH = MIN IO = 15mA ±10% VCC 2.0 V B0–B7 IOH = –15mA ±5% VCC 2.0 V A0 A7 VCC = MIN IOL = 20mA ±10% VCC 0.30 0.50 V VOL Low-level output voltage A0–A7 VCC = MIN, VIL = MAX, V MIN IOL = 24mA ±5% VCC 0.35 0.50 V B0–B7 VIH = MIN IOL = MAX ±10% VCC 0.55 V VOL Low-level output voltage B0–B7 VCC = MIN, VIL = MAX, VIH = MIN IOL = MAX ±5% VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V I Input current at maximum OE, T/R VCC = 5.5V, VI = 7.0V 100 µA II input voltage A0–A7, B0–B7 VCC = 5.5V, VI = 5.5V 1 mA IIH High-level input current OE, T/R only VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current OE, T/R only VCC = MAX, VI = 0.5V –1.2 mA IIH+IOZH Off-state output current High level voltage applied VCC = MAX, VO = 2.7V 70 µA IIL+IOZL Off-state output current Low level voltage applied VCC = MAX, VO = 0.5V –600 µA IOS Short circuit output current3 A0–A7 VCC = MAX –60 –150 mA IOS Short-circuit output current3 B0–B7 VCC = MAX –100 –225 mA ICCH 60 87 mA ICC Supply current (total) ICCL VCC = MAX 70 100 mA ICCZ 75 110 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω UNIT MIN TYP MAX MIN MAX tPLH tPHL Propagation delay An to Bn, Bn to An Waveform 1 2.5 2.5 3.5 4.0 6.0 6.0 2.5 2.5 7.0 7.0 ns tPZH tPZL Output Enable time to High or Low level Waveform 2 Waveform 3 2.0 3.5 4.5 5.5 7.0 8.0 2.0 3.5 8.0 9.0 ns tPHZ tPLZ Output Disable time from High or Low level Waveform 2 Waveform 3 2.5 1.0 5.0 3.5 6.5 6.0 2.0 1.0 7.5 7.0 ns |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
