NSAM265SF datasheet(21/58 Pages) NSC

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30 Command Set (Continued)

Mnemonic

Command

Type

Description

Opcode

Hex

Command Parameters

Return Value

Description

Length

Description

Length

Bytes

SDET

Set Detectors Mask

Detectors Mask

None

Skip to End of Message

None

SETD

Set Time and Day

TimeDay

None

Skip Forward

Length of Time

None

SMT

Set Message Tag

Message Tag

None

Say One Word

Word Number

None

SPS

Set Playback Speed

Speed Value

None

Say Sentence

Sentence

None

Set Vocabulary Type

Mode Id

1 a 1

None

Say Words

N Word1

Wordn

1 a n

None

TUNE

Tune Index

Index Value

1 a 2

None

Volume Control

IncrementDecrement

None

WRAM

Write RAM

Message Tag Data

2 a 32

None

32 COMMANDS DESCRIPTION

The commands are listed in alphabetical order

Each command indicates by a

the chips for which it is

intended Commands which are not intended for a particular

chip are valid for that chip but have no effect Chip-specific

features of a command which is intended for both chips are

indicated by the chip name in the margin

The execution time for all commands when specified in-

cludes the time required for the microcontroller to retrieve

the return value where appropriate

The execution time does not include the protocol timing

overhead ie the execution times are measured from the

moment that the command is detected as valid until the

command is fully executed

AMAP

Check and Map ARAM

action

number

NSAM265SR

NSAM265SFV

This command runs diagnostics on the ARAMs and returns

a 1-byte result The following actions are performed accord-

ing to the 1-byte

action

number parameter

Action 0

Checks the ARAM configuration The return value is encod-

ed as follows

Bits 0 – 1

Number of ARAM devices (1 or 2)

Bits 2 – 3

Number of ARAM columns in multiples of 1k

units (1 or 2)

Bits 4 – 6

Number of ARAM rows in multiples of 1k units (1

2or4)

Action 1

This action is intended to be carried out on the production

line It performs the following tests

Address line test

Scan one row from start to end and from end to start

Write to line X and check that line Y is not written (RAS

CAS not connected test)

Walking 1 and walking 0 on the data lines

Action 1 then performs Action 3 (see below) on the first 60

rows only This allows you to record a short memo of up to

5-seconds duration to check the system and codec Execu-

tion time is less than 1 second

This action returns 0 if the ARAMs pass the connectivity

test or the ID of the first ARAM to fail The return value is

1-byte long IDs are allocated according to the following

scheme

TLEE12378 – 15

Action 2

Performs a one-pass test clears the entire ARAM to 0 and

marks all the bad rows in the internal row table If more than

05% nibbles in a row are bad the row is mapped as bad If

more than 200 of the rows are bad the EV

ERROR bit in

the status word and the ERR

ARAM bit in the error word

are set to 1

This operation does not detect ARAM cross-talk problems

Action 2 of the AMAP command should be invoked immedi-

ately after the INIT command and is valid only in the IDLE

state If this command is not issued the ARAM is consid-

ered as a DRAM (no errors)

The test takes up to 20 seconds

Action 3

Performs a two-pass test to map and return the number of

bad rows If more than 05% nibbles in a row are bad the

row is mapped as bad If more than 5% of the rows are bad

the EV

ERROR bit in the status word and the ERR

ARAM bit in the error word are set to 1 This diagnostic also

detects ARAM cross-talk problems

NSAM265SF Datasheet(PDF) 21 Page - National Semiconductor (TI)

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