Philips Semiconductors

Product specification

74LVT16374A

3.3V 16-bit edge-triggered D-type flip-flop

(3-State)

1999 Oct 18

4

FUNCTION TABLE

INPUTS

INTERNAL

OUTPUTS

OPERATING MODE

nOE

nCP

nDx

REGISTER

nQ0 - nQ7

OPERATING MODE

L

L

↑

↑

l

h

L

H

L

H

Load and read register

L

↑

X

NC

NC

Hold

H

H

↑

↑

X

nDx

NC

nDx

Z

Z

Disable outputs

H = High voltage level

h

= High voltage level one set-up time prior to the High-to-Low E transition

L

= Low voltage level

l

= Low voltage level one set-up time prior to the High-to-Low E transition

NC= No change

X = Don’t care

Z = High impedance “off” state

↑ = Low-to-High clock transition

↑ = Not a Low-to-High clock transition

LOGIC DIAGRAM

CP Q

D

nD0

nQ0

CP Q

D

nD1

CP Q

D

nD2

CP Q

D

nD3

CP Q

D

nD4

CP Q

D

nD5

CP Q

D

nD6

CP Q

D

nD7

nQ1

nQ2

nQ3

nQ4

nQ5

nQ6

nQ7

nCP

nOE

SW00019

SYMBOL

PARAMETER

CONDITIONS

RATING

UNIT

DC supply voltage

-0.5 to +4.6

V

DC input diode current

-50

mA

-0.5 to +7.0

V

DC output diode current

-50

mA

Output in Off or High state

-0.5 to +7.0

V

DC output current

Output in Low state

128

mA

DC out ut current

Output in High state

-64

mA

Storage temperature range

-65 to +150

°C

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the

device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device reliability.

2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction

temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150

°C.

3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.