ACTS08MS

FN3994 Rev 0.00

Page 4 of 8

April 1995

TABLE 5. DELTA PARAMETERS (+25oC)

PARAMETER

SYMBOL

(NOTE 1)

DELTA LIMIT

UNITS

Supply Current

ICC

1.0

A

Output Current

IOL/IOH

15

%

NOTE:

1. All delta calculations are referenced to 0 hour readings or pre-life readings.

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUP

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Preburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

Interim Test 1 (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

Interim Test 2 (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

PDA

100%/5004

1, 7, 9, Deltas

Interim Test 3 (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

PDA

100%/5004

1, 7, 9, Deltas

Final Test

100%/5004

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/5005

1, 7, 9

NOTE:

1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUP

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. BURN-IN TEST CONNECTIONS (+125oC < TA < 139oC)

OPEN

GROUND

1/2 VCC = 3V

0.5V

VCC = 6V

0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I (Note 1)

-

1, 2, 4, 5, 7, 9, 10,

12, 13

3, 6, 8, 11

14

-

-

STATIC BURN-IN II (Note 1)

-

7

3, 6, 8, 11

1, 2, 4, 5, 9, 10, 12, 13, 14

-

-

DYNAMIC BURN-IN TEST CONNECTIONS (Note 1)

-

7

3, 6, 8, 11

14

1, 2, 4, 5, 9, 10, 12, 13

-

NOTE:

1. Each pin except VCC and GND will have a series resistor of 500

 5%.

TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25oC,

5oC)

FUNCTION

OPEN

GROUND

VCC = 5V

0.5V

Irradiation Circuit (Note 1)

3, 6, 8, 11

7

1, 2, 4, 5, 9, 10, 11, 12, 13, 14

NOTE:

1. Each pin except VCC and GND will have a series resistor of 47k

 5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.