Nexperia

BAS716

Low-leakage diode

11. Test information

trr

(1)

+ IF

t

output signal

tr

tp

t

10 %

90 %

VR

input signal

V = VR + IF × RS

RS = 50 Ω

IF

D.U.T.

Ri = 50 Ω

SAMPLING

OSCILLOSCOPE

mga881

(1) IR = 1 mA

Fig. 6. Reverse recovery time test circuit and waveforms

Quality information

This product has been qualified in accordance with the Automotive Electronics Council (AEC)

standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in

automotive applications.

12. Package outline

REFERENCES

OUTLINE

VERSION

EUROPEAN

PROJECTION

ISSUE DATE

IEC

JEDEC

JEITA

SOD523

SC-79

02-12-13

06-03-16

Plastic surface-mounted package; 2 leads

SOD523

0

0.5

1 mm

scale

D

1

2

HE

E

bp

A

c

v M A

A

UNIT

bp

c

D

E

v

mm

A

HE

DIMENSIONS (mm are the original dimensions)

Note

1. The marking bar indicates the cathode.

(1)

0.34

0.26

0.17

0.11

0.1

0.85

0.75

1.25

1.15

0.65

0.58

1.65

1.55

Fig. 7. Package outline SC-79 (SOD523)

BAS716

All information provided in this document is subject to legal disclaimers.

© Nexperia B.V. 2020. All rights reserved

Product data sheet

2 October 2020

5 / 9