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EBWM2512 Datasheet(PDF) 2 Page - C&B ELECTRONICS (SHENZHEN) CO., LTD

Part # EBWM2512
Description  Precision Trimming-free Alloy Current Sensing Resistor
PDF  2 Pages
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Manufacturer  RESI [C&B ELECTRONICS (SHENZHEN) CO., LTD]
Direct Link  https://en.resistor.today/
Logo RESI - C&B ELECTRONICS (SHENZHEN) CO., LTD

EBWM2512 Datasheet(HTML) 2 Page - C&B ELECTRONICS (SHENZHEN) CO., LTD

  EBWM2512 Datasheet HTML 1Page - C&B ELECTRONICS (SHENZHEN) CO., LTD EBWM2512 Datasheet HTML 2Page - C&B ELECTRONICS (SHENZHEN) CO., LTD  
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( P100°C Rated temp.)
Stability<0.5%
180
160
140
120
100
80
60
40
20
0
0
20
40
60
80
100
120
175
150
125
100
75
50
25
0
-25
-50
-75
0
20
40
60
80
100
120
℃
0
7
1
℃
0
7
℃
5
6
-
Derating curve(Ambient temp.)
Ambient temperature°C
Terminal temperature°C
Stability<1.0%
( P70°C Rated temp.)
Derating curve(Terminal temp.)
EBWM2512
Precision Trimming-free Alloy Current Sensing Resistor
TCR Test Chart-0.5mΩ
TCR Test Chart-1mΩ
Temperature
Temperature
Datasheet no. E05014
Ver V0
Date 2022/7/28
No.：
E05014Version：
V1
Date：
2022/11/26
C&B Electronics Shenzhen Co.,Ltd|
| resi@cbeureka.com | Tel:0755-83981080/83981010
www.resistor.today
Performance
±0.1%
±0.2%
±
0.5%
±
0.2%
±
0.2%
±
0.1%
±0.05%
±0.05%
Typical
±0.5%
±0.5%
±
1.0%
±
0.5%
±
0.5%
±
0.5%
±
0.2%
±
0.2%
MIL-STD-202 Method 106
MIL-STD-202 Method 108
J-STD-202
MIL-STD-202 Method 210
MIL-STD-202 Method 201
MIL-STD-202 Method 103
MIL-STD-202 Method 204
MIL-STD-202 Method 107
IEC 60115-1 4.8
AEC-Q200-005
AEC-Q200-006
MIL-STD-202 Method 215
±0.1%
±0.1%
±0.5%
±0.01%
±0.01%
±
0.2%
IEC 60068-2-1
IEC 60115-1 4.36
Test ltem
T=24h/cycle,no load,7a and 7b not required,measured 24±2h after test
Short-time overload
Moisture resistance
Load life
Resistance to soldering heat
High temp. & high humidity
Low temp. storage
Vibration
Mechanical shock
Resistance to solvent
TCR
Substrate bending
Terminal strength
Low temp. operation
Solderability
Test Method
Standard
Maximum
5x rated power for 5s,measured 24±2h after test
+70°C,2000h,rated power,measured 24±2h after test
+260,±5°C,10s±1s,measured 24±2h after test
+85°C,85%RH,10% of rated power,1000h,measured 24±2h after test
-65°C for 96h,measured 24±2h after test
Frequency varied 10Hz to 2000Hz in 20 minutes,acceleration 5g
X-Y-Z direction°C12 cycles
100g,6ms,half-sine shock wave,3 times/direction,18 times
measured 24±2h after test
Immerse in solvent for 3 min and then wipe 10 times
3 cycles of 3 solvents,clean and dry at ambient temperature
Clear marking
No visible damage
+235°C±5°C,2s±0.5s
95% coverd
-55°C and +170°C,+20°C Ref.
Within the nominal
value range
2mm,for 60s
Force 17.7N,hold for 60s
-55°C,no load for 1h,rated voltage load for 45 min,no load for 15 min
Thermal shock
-55°C~+125°C,1000 cycles,measured 24±2h after test
JESD22 Method JA-104
±0.1%
±
0.5%



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