4

INDUSTRIALTEMPERATURERANGE

IDT74FCT16543AT/CT

FAST CMOS 16-BIT LATCHED TRANSCEIVER

POWER SUPPLY CHARACTERISTICS

Symbol

Parameter

Test Conditions(1)

Min.

Typ.(2)

Max.

Unit

ΔICC

Quiescent Power Supply

VCC = Max.

—

0.5

1.5

mA

Current TTL Inputs HIGH

VIN = 3.4V(3)

ICCD

Dynamic Power Supply Current(4)

VCC = Max., Outputs Open

VIN = VCC

—

60

100

µA/

xCEAB and xOEAB = GND

VIN = GND

MHz

xCEBA = VCC

OneInputToggling

50% Duty Cycle

IC

TotalPowerSupplyCurrent(6)

VCC = Max., Outputs Open

VIN = VCC

—

0.6

1.5

mA

fi = 10MHz

VIN = GND

50% Duty Cycle

xLEAB, xCEAB and

xOEAB = GND

VIN = 3.4V

—

0.9

2.3

xCEBA = VCC

VIN = GND

OneBitToggling

VCC = Max., Outputs Open

VIN = VCC

—

2.4

4.5(5)

fi = 2.5MHz

VIN = GND

50% Duty Cycle

xLEAB, xCEAB and

xOEAB = GND

VIN = 3.4V

—

6.4

16.5(5)

xCEBA = VCC

VIN = GND

Sixteen BitsToggling

NOTES:

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC

IC = ICC +

ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)

ICC = Quiescent Current (ICCL

, ICCH and ICCZ)

ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)

DH = Duty Cycle for TTL Inputs High

NT = Number of TTL Inputs at DH

ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)

fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)

NCP = Number of Clock Inputs at fCP

fi = Input Frequency

Ni = Number of Inputs at fi