TC253SPD

680×500 PIXEL CCD IMAGE SENSOR

SOCS062B – JANUARY 2001 – REVISED MAY 2002

10

POST OFFICE BOX 655303

electrical characteristics over recommended ranges of supply voltage and operating free-air

temperature (unless otherwise noted)

PARAMETER

MIN

TYP†

MAX

UNIT

Charge multiplication gain

1

30

(100)‡

Charge multiplication gain temperature coefficient

%/

°C

Excess noise factor for typical CCM gain (see Note 2)

1

1.2

1.4

Dynamic range without CCM gain

58

dB

Dynamic range with typical CCM gain (see Note 3)

50

dB

Charge conversion gain without CCM (see Note 4)

10

µV/e

τ

Signal-response delay time (see Note 5)

9

ns

Output resistance

320

Ω

Amplifier noise-equivalent signal without CCM gain §

42

e

Amplifier noise-equivalent signal with typical CCM gain §

1.5

e

Response linearity with no CCM gain

1

Response linearity with typical CCM gain

1

Charge-transfer efficiency (see Note 6)

0.9998

0.9999

Supply current

2

3

4

mA

IAG-1

2.95

IAG-2

3.22

IAG-1–IAG2

1.98

nF

SAG-1

3.04

nF

SAG-2

3.62

C

Inp t capacitance

SAG-1–SAG2

2.22

Ci

Input capacitance

SRG-1

40

SRG-2

40

SRG-1–SRG2

pF

CMG

30

pF

CMG–SRG1

ODB

1,000

ADB high (see Note 7)

20

SRG-1, 2 high (see Note 7)

45

Pulse amplitude rejection ratio

SRG-1, 2 low (see Note 7)

45

dB

Pulse amplitude rejection ratio

CMG high (see Note 7)

45

dB

CMG low (see Note 7)

45

ODB low (see Note 7)

45

† All typical values are at TA = 25°C.

‡ Maximum CCM gain is not ensured.

§ The values in this table are quoted using correlated double sampling (CDS), which is a signal processing technique that improves performance

by minimizing undesirable effects of reset noise.

NOTES:

2. Excess noise factor F is defined as the ratio of noise sigma after multiplication divided by M times the noise sigma before

multiplication where M is the charge multiplication gain.

3. Dynamic range is –20 times the logarithm of the mean noise sigma divided by the saturation output signal amplitude.

4. Charge conversion factor is defined as the ratio of output signal to input number of electrons.

5. Signal-response delay time is the time between the falling edge of the SRG2 pulse and the output signal valid state.

6. Charge transfer efficiency is 1 minus the charge loss per transfer in the CCD register. The test is performed in the dark using either

electrical or optical input.

7. Rejection ratio is –20 times the logarithm of the output referenced to the reset level divided by the 1 V of amplitude change of the

corresponding gate or terminal signal.