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74ACT374 Datasheet(PDF) 2 Page - ON Semiconductor

Part # 74ACT374
Description  Octal D?뭈ype Flip?묯lop with 3?뭆tate Outputs
PDF  10 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

74ACT374 Datasheet(HTML) 2 Page - ON Semiconductor

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MC74AC374, MC74ACT374
http://onsemi.com
2
TRUTH TABLE
Inputs
Outputs
Dn
CP
OE
On
H
L
H
L
L
L
X
X
H
Z
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
= LOW-to-HIGH Transition
FUNCTIONAL DESCRIPTION
The MC74AC374/74ACT374 consists of eight edge−
triggered flip−flops with individual D−type inputs and
3−state true outputs. The buffered clock and buffered Output
Enable are common to all flip−flops. The eight flip−flops
will store the state of their individual D inputs that meet the
setup and hold time requirements on the LOW−to−HIGH
Clock (CP) transition. With the Output Enable (OE) LOW,
the contents of the eight flip−flops are available at the
outputs. When the OE is HIGH, the outputs go to the high
impedance state. Operation of the OE input does not affect
the state of the flip−flops.
Figure 3. Logic Diagram
CP D
QQ
CP D
QQ
CP D
QQ
CP D
QQ
CP D
QQ
CP D
QQ
CP D
QQ
CP D
QQ
D0
D1
D2
D3
D4
D5
D6
D7
O0
O1
O2
O3
O4
O5
O6
O7
OE
CP
NOTE:
That this diagram is provided only for the understanding of logic
operations and should not be used to estimate propagation delays.
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage (Referenced to GND)
−0.5 to +7.0
V
VIN
DC Input Voltage (Referenced to GND)
−0.5 to VCC +0.5
V
VOUT
DC Output Voltage (Referenced to GND)
−0.5 to VCC +0.5
V
IIN
DC Input Current, per Pin
±20
mA
IOUT
DC Output Sink/Source Current, per Pin
±50
mA
ICC
DC VCC or GND Current per Output Pin
±50
mA
Tstg
Storage Temperature
−65 to +150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.



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