 2013-2018 Microchip Technology Inc.

DS20005193E-page 23

SST25WF040B

6.5

DC Characteristics

TABLE 6-5:

DC OPERATING CHARACTERISTICS

Symbol Parameter

Limits

Test Conditions

Min

Typ1

1. Value characterized, not fully tested in production.

Max

Units

IDDR

Read Current

6

mA

CE#=0.1 VDD/0.9 VDD@30

MHz, SO=open; Single I/O

IDDR2

Read Current

8

mA

CE#=0.1 VDD/0.9VDD@40

MHz, SO=open

IDDR3

Read Current

10

mA

CE#=0.1 VDD/0.9VDD@40

MHz, SO=open; Dual I/O;

IDDW

Program and Erase Current

15

mA

CE#=VDD

ISB

Standby Current

Industrial

750

µA

CE#=VDD, VIN=VDD or VSS

Extended

770

µA

CE#=VDD, VIN=VDD or VSS

IDPD

Deep Power-Down

Industrial

210

µA

CE#=VDD, VIN=VDD or VSS

Extended

250

µA

CE#=VDD, VIN=VDD or VSS

ILI

Input Leakage Current

2

µA

VIN=GND to VDD, VDD=VDD

Max

ILO

Output Leakage Current

2

µA

VOUT=GND to VDD, VDD=VDD

Max

VIL

Input Low Voltage

-0.3

0.3

V

VDD=VDD Min

VIH

Input High Voltage

0.7 VDD

VDD+0.3

V

VDD=VDD Max

VOL

Output Low Voltage

0.2

V

IOL=100 µA, VDD=VDD Min

VOH

Output High Voltage

VDD-0.2

V

IOH=-100 µA, VDD=VDD Min

TABLE 6-6:

CAPACITANCE (TA = 25°C, F=1 MHZ, OTHER PINS OPEN)

Parameter

Description

Test Condition

Maximum

COUT1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Output Pin Capacitance

VOUT = 0V

12 pF

CIN1

Input Capacitance

VIN = 0V

6 pF

TABLE 6-7:

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Minimum Specification

Units

Test Method

NEND1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Endurance

100,000

Cycles JEDEC Standard A117

Status Register Write Cycle

100,000

Cycles JEDEC Standard A117

TDR1

Data Retention

20

Years

JEDEC Standard A103

ILTH1

Latch Up

100 + IDD

mA

JEDEC Standard 78