-

180

-

±10

±9.5

-

±6.3

-

-

±11

-

6

±6.3

-

-

±11

-

6

±5

-

±6

-

0.97

-

±5

±10

±6

±10

0.97

-

-

-

-

-

0.95

-

-

-

-

-

0.95

0.92

±10

-

10

-

-

12

Ω

Ω f=1.0KHz

Ω

Ω f=1.0KHz

Ω

f=1.0KHz

Ω

±20V

±20V

600mW

-55°C to +125°C

-40°C to +85°C

ABSOLUTE MAXIMUM RATINGS

Storage Temperature Range

Lead Temperature Range

(10 Seconds)

Junction Temperature

Thermal Resistance @ TC=125°C

Output Devices

-65°C to +150°C

+300°C

+175°C

55°C/W

Tc

1

2

3

4

5

6

Subgroups 5 & 6 shall be tested as part of device initial characterization and after design

and process changes. Parameter shall be guaranteed to the limits specified for subgroups

5 & 6 for all lots not specifically tested.

Devices shall be capable of meeting the parameter, but need not be tested.

Subgroup 1,4

Subgroup 2,5

Subgroup 3,6

Continuous operation at or above absolute maximum ratings may adversly effect the device performance and/or life cycle.

Consult factory for post radiation limits.

NOTES:

Supply Voltage

Input Voltage

Power Dissipation

Case Operating Temperature

(MSK 0002K/H/E RH)

(MSK 0002RH)

ELECTRICAL SPECIFICATIONS

2

Quiescent Current

Input Current

Output Offset Voltage

Input Impedance

Output Impedance

Output Voltage Swing

Voltage Gain

Rise Time

Parameter

Test Conditions

Group A

Subgroup

4

3

2

3

Min.

Typ.

Max.

MSK 0002K/H/E RH

Min.

Typ.

Max.

MSK 0002RH

Units

1

4

4

4

4

4

1

2,3

1

2,3

4

5,6

-

180

-

±10

±9.5

-

±12

-

10

-

-

15

mA

K

Ω

Ω

Vp

Vp

nS

±15

±20

±30

±30

-

-

µA

µA

mV

mV

V/V

V/V

±20

-

±35

-

-

-

1

5

6

Rev. A

4/07