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MSK4900 Datasheet(PDF) 2 Page - M.S. Kennedy Corporation

Part # MSK4900
Description  600V ISOLATED HALF BRIDGE GATE DRIVER
PDF  6 Pages
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Manufacturer  MSK [M.S. Kennedy Corporation]
Direct Link  http://www.mskennedy.com
Logo MSK - M.S. Kennedy Corporation

MSK4900 Datasheet(HTML) 2 Page - M.S. Kennedy Corporation

  MSK4900 Datasheet HTML 1Page - M.S. Kennedy Corporation MSK4900 Datasheet HTML 2Page - M.S. Kennedy Corporation MSK4900 Datasheet HTML 3Page - M.S. Kennedy Corporation MSK4900 Datasheet HTML 4Page - M.S. Kennedy Corporation MSK4900 Datasheet HTML 5Page - M.S. Kennedy Corporation MSK4900 Datasheet HTML 6Page - M.S. Kennedy Corporation  
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Typ.
15.00
TBD
-
-
0.15
-
15.0
-5.0
-
-
TBD
TBD
TBD
TBD
TBD
TBD
TBD
Vcc SUPPLY CHARACTERISTICS
Vcc Voltage
Vcc Current
INPUT/OUTPUT LOGIC
Positive Trigger Input Voltage
Negative Trigger Input Voltage
Open Collector Ouput - VOL
Open Collector Ouput - IOL
OUTPUT CHARACTERISTICS - GATE DRIVE
VOH
VOL
IOH
IOL
ISD
tplh - Propagation Delay Time
tphl - Propagation Delay Time
tr - Rise Time
tf - Fall Time
td - De-Sat Delay Time
De-Sat Trip Voltage
600V
5.5V
18V
TBD
8A
TBD
High Voltage Isolation
Logic Input Voltage
Vcc Supply
Continuous Output Current
Peak Ouput Current
Thermal Resistance
(output drivers - junction to case)
V
mA
V
V
V
mA
V
V
A
A
µS
µS
µS
µS
µS
µS
V
ABSOLUTE MAXIMUM RATINGS
-65°C to +150°C
+300°C
-40°C to +85°C
-55°C to +125°C
+150°C
TST
TLD
TC
TJ
Parameter
ELECTRICAL SPECIFICATIONS
Units
Max.
15.75
TBD
-
0.8
0.4
1.5
15.75
-4.25
-
-
TBD
TBD
TBD
TBD
TBD
TBD
TBD
MSK 4900
Typ.
15.00
TBD
-
-
0.15
-
15.0
-5.0
-
-
TBD
TBD
TBD
TBD
TBD
TBD
TBD
Test Conditions
Min.
14.25
TBD
2.0
-
-
-
14.25
-5.75
8
8
TBD
TBD
TBD
TBD
TBD
TBD
TBD
Storage Temperature Range
Lead Temperature Range
(10 Seconds)
Case Operating Temperature
MSK4900
MSK4900H/E
Junction Temperature
All Ratings: Tc=+25°C Unless Otherwise Specified
2
Max.
15.75
TBD
-
0.8
0.4
1.5
15.75
-4.25
-
-
TBD
TBD
TBD
TBD
TBD
TBD
TBD
MSK 4900H/E
Min.
14.25
TBD
2.0
-
-
-
14.25
-5.75
8
8
TBD
TBD
TBD
TBD
TBD
TBD
TBD
NOTES:
1
Guaranteed by design but not tested. Typical parameters are representative of actual device
performance but are for reference only.
2
Industrial grade and "E" suffix devices shall be tested to subgroups 1 and 4 unless otherwise specified.
3
Military grade devices ("H" Suffix) shall be 100% tested to Subgroups 1, 2, 3 and 4.
4
Subgroups 5 and 6 testing available upon request.
5
Subgroup 1, 4 TA = TC = +25°C
2, 5 TA = TC = +125°C
3, 6 TA = TC = -55°C
6
Continuous operation at or above absolute maximum ratings may adversly effect the device
performance and/or life cycle.
Group A
Subgroup
CL=0.33µF, 20KHz pulse
6
PRELIMINARY
Rev. - 1/07
IOL=1.5mA
CL=0.33µF, 20KHz pulse



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