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NE531FE Datasheet(PDF) 3 Page - NXP Semiconductors

Part # NE531FE
Description  High slew rate operational amplifier
PDF  8 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

NE531FE Datasheet(HTML) 3 Page - NXP Semiconductors

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Philips Semiconductors Linear Products
Product specification
NE/SE531
High slew rate operational amplifier
August 31, 1994
72
DC ELECTRICAL CHARACTERISTICS
VS=±15V, unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
SE531
NE531
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
Min
Typ
Max
Min
Typ
Max
UNIT
VOS
Offset voltage
RS≤10kΩ, TA=25°C
RS310kΩ, over temp
2.0
5.0
6.0
2.0
6.0
7.5
mV
mV
∆VOS
Over temp
10
10
µV/°C
IOS
Offset current
TA=25°C
TA=High
TA=Low
30
200
200
500
50
200
200
300
nA
nA
nA
∆IOS
Over temp
0.4
0.4
nA/
°C
IBIAS
Input bias current
T=25
°C
TA=High
TA=Low
300
500
500
1500
400
1500
1500
2000
nA
nA
nA
∆IBIAS
Over temp
2
2
nA/
°C
VCM
Common-mode voltage range
TA=25°C
±10
±10
V
CMRR
Common-mode rejection ratio
TA=25°C, RS≤10kΩ
70
100
dB
Over temp RS≤10kΩ
70
90
dB
RIN
Input resistance
TA=25°C
20
20
M
Ω
VOUT
Output voltage swing
RL≥10kΩ, over temp
±10
±13
±10
±13
V
ICC
Supply current
TA=25°C
7.0
10
mA
TMAX
7.0
10
mA
PD
Power consumption
TA=25°C
210
300
mW
RS≤10kΩ, TA=25°C
10
150
µV/V
PSRR
Power supply rejection ratio
RS≤10kΩ, over temp
10
150
µV/V
ROUT
Output resistance
TA=25°C
75
75
Ω
TA=25°C,
RL≥10kΩ, VOUT=±10V
50
100
20
60
V/mV
AVOL
Large-signal voltage gain
RL≥10kΩ, VOUT=±10V,
over temp
25
15
V/mV
VINN
Input noise voltage
25
°C f=1kHz
20
20
nV/
√Hz
ISC
Short-circuit current
25
°C
5
15
45
5
15
45
mA
AC ELECTRICAL CHARACTERISTICS
TA=25°C VS=+15V, unless otherwise specified.1
SYMBOL
PARAMETER
TEST CONDITIONS
SE531
NE531
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
Min
Typ
Max
Min
Typ
Max
UNIT
BW
Full power bandwidth
500
500
kHz
tS
Settling time (1%)
(0.1%)
AV=+1, VIN=±10V
1.5
2.5
1.5
2.5
µs
µs
Large-signal overshoot
AV=+1, VIN=±10V
2
2
%
Small-signal overshoot
AV=+1, VIN=400mV
5
5
%
tR
Small-signal rise time
AV=+1, VIN=400mV
300
300
ns
SR
Slew rate
AV=100
35
35
V/
µs
AV=10
35
35
V/
µs
AV=1 (non-inverting)
20
30
30
V/
µs
AV=1 (inverting)
25
35
35
V/
µs
NOTES:
1. All AC testing is performed in the transient response test circuit.



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