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1389CS–CASIC–06-Nov-06

ATC18 Summary

1.1

Absolute Maximum Ratings

Operation of a device outside the range given in Table 1-2 may cause permanent damage to the

device and/or affect reliability.

The Atmel cell libraries have been designed in order to be compatible with each other. Simula-

tion representations exist for three types of operating conditions. They correspond to the

characterization conditions defined as follows:

• MIN conditions (industrial best case):

T

V

Process = fast

• TYP conditions (industrial typical case):

T

V

Process = typ

• MAX conditions (industrial worst case):

T

V

Process = slow

Delays to tristate are defined as delay to turn off (VGS < VT) of the driving devices.

Output pad drain current corresponds to the output current of the pad when the output voltage is

V

out of the die) are taken into account. In order to have accurate timing estimates, all character-

ization has been run on electrical netlists extracted from the layout database.

Table 1-2.

Absolute Maximum Ratings

Symbol

Parameter

Conditions

Min

Max

Unit

V

DD

DC Supply Voltage

Core

-0.3

2.0

V

DC Supply voltage

2.5V Interface I/Os

-0.3

4.0

V

DC Supply Voltage

3.3V Interface I/Os

-0.3

4.0

V

V

I

DC Input Voltage,1.8V I/Os

-0.3

V

V

DC Input Voltage, 3.3V I/Os

-0.3

V

V

O

DC Output Voltage, 1.8V I/Os

-0.3

V

DC Output Voltage, 3.3V I/Os

-0.3

V

V

TEMP

Operating Free Air Temperature

Range

Industrial

-40

+125

° C

TSG

Storage Temperature

-60

+150

° C