Analog Integrated Circuit Device Data

Freescale Semiconductor

5

33880

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 3. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Ratings

Symbol

Value

Unit

VDD Supply Voltage (1)

-0.3 to 7.0

CS, DI, DO, SCLK, IN5, IN6, and EN (1)

–

-0.3 to 7.0

VPWR Supply Voltage (1)

-16 to 50

Drain 1–8 (2)

5.0 mA

≤ I

–

-18 to 40

Source 1–8 (3)

5.0 mA

≤ I

–

-28 to 40

Output Voltage Clamp Low-Side Drive (4)

40 to 55

Output Voltage Clamp High-Side Drive (4)

-15 to -25

Output Clamp Energy (5)

50

mJ

ESD Voltage (6)

Human Body Model

Machine Model

±2000

±200

V

Storage Temperature

-55 to 150

Operating Case Temperature

-40 to 125

Operating Junction Temperature

-40 to 150

Maximum Junction Temperature

–

-40 to 150

(7)

28 SOIC, Case 751F-05

32 SOIC, Case 1324-02

1.3

1.7

W

Thermal Resistance, Junction-to-Ambient, 28 SOIC, Case 751F-05

94

Thermal Resistance, Junction-to-Ambient, 32 SOIC, Case 1324-02

Thermal Resistance, Junction-to-Thermal Ground Leads, 32 SOIC, Case 1324-02

70

18

Peak Package Reflow Temperature During Reflow (5), (6)

Note 6

°C

Notes

1.

Exceeding these limits may cause malfunction or permanent damage to the device.

2.

Configured as low-side driver with 300 mA load as current limit.

3.

Configured as high-side driver with 300 mA load as current limit.

4.

With outputs OFF and 10 mA of test current for low-side driver, 30 mA test current for high-side driver.

5.

Maximum output clamp energy capability at 150

6.

7.

Maximum power dissipation with no heatsink used.