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IRFR024 Datasheet(PDF) 2 Page - EVER SEMICONDUCTOR CO.,LIMITED

Part # IRFR024
Description  N-Channel Enhancement Mode MOSFET
PDF  5 Pages
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Manufacturer  EVVOSEMI [EVER SEMICONDUCTOR CO.,LIMITED]
Direct Link  https://www.evvosemi.com
Logo EVVOSEMI - EVER SEMICONDUCTOR CO.,LIMITED

IRFR024 Datasheet(HTML) 2 Page - EVER SEMICONDUCTOR CO.,LIMITED

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RθJA
Thermal Resistance Junction-Ambient 1
62
℃
/W
RθJC
Thermal Resistance Junction-Case1
3.6
℃
/W
Electrical Characteristics (TJ=25 ℃, unless otherwise noted)
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
BVDSS
Drain-Source Breakdown Voltage
VGS=0V , ID=250uA
60
---
---
V
△BVDSS/△TJ BVDSS Temperature Coefficient
Reference to 25℃ , ID=1mA
---
0.063
---
V/℃
RDS(ON)
Static Drain-Source On-Resistance2
VGS=10V , ID=15A
---
22
m
26
Ω
VGS=4.5V , ID=10A
---
30
38
VGS(th)
Gate Threshold Voltage
VGS=VDS , ID =250uA
1.2
---
2.5
V
△VGS(th)
VGS(th) Temperature Coefficient
---
-5.24
---
mV/℃
IDSS
Drain-Source Leakage Current
VDS=48V , VGS=0V , TJ=25℃
---
---
1
uA
VDS=48V , VGS=0V , TJ=55℃
---
---
5
IGSS
Gate-Source Leakage Current
VGS=±20V , VDS=0V
---
---
±
100
nA
gfs
Forward Transconductance
VDS=5V , ID=15A
---
17
---
S
Rg
Gate Resistance
VDS=0V , VGS=0V , f=1MHz
---
3.2
---
Ω
Qg
Total Gate Charge (4.5V)
VDS=48V , VGS=4.5V , ID=12A
---
12.6
---
nC
Qgs
Gate-Source Charge
---
3.2
---
Qgd
Gate-Drain Charge
---
6.3
---
Td(on)
Turn-On Delay Time
VDD=30V , VGS=10V ,
RG=3.3 ,
ID=10A
---
8
---
ns
Tr
Rise Time
---
14.2
---
Td(off)
Turn-Off Delay Time
---
24.4
---
Tf
Fall Time
---
4.6
---
Ciss
Input Capacitance
VDS=15V , VGS=0V , f=1MHz
---
1378
---
pF
Coss
Output Capacitance
---
86
---
Crss
Reverse Transfer Capacitance
---
64
---
IS
Continuous Source Current1,5
VG=VD=0V , Force Current
---
---
23
A
ISM
Pulsed Source Current2,5
---
---
46
A
VSD
Diode Forward Voltage2
VGS=0V , IS=1A , TJ=25℃
---
---
1.2
V
Note :
1.The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2.The data tested by pulsed , pulse width
≦ 300us , duty cycle ≦ 2%
3.The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=22.6A
4.The power dissipation is limited by 150
℃ junction temperature
5.The data is theoretically the same as ID and IDM , in real applications , should be limited by total power
dissipation.
IRFR024
N-Channel Enhancement Mode MOSFET
2
Rev:2023A2



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