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IRLML2502 Datasheet(PDF) 2 Page - EVER SEMICONDUCTOR CO.,LIMITED |
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IRLML2502 Datasheet(HTML) 2 Page - EVER SEMICONDUCTOR CO.,LIMITED |
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2 / 4 page ![]() Parameter Symbol Test Condition Min Typ Max Units Static Drain-source breakdown voltage V(BR)DSS VGS = 0V, ID =10µA 20 Gate-threshold voltage VGS(th) VDS =VGS, ID =50µA 0.65 1.2 V Gate-body leakage IGSS VDS =0V, VGS =±8V ±100 nA Zero gate voltage drain current IDSS VDS =20V, VGS =0V 1 µA VGS =4.5V, ID =4.2A 0.035 0.045 Drain-source on-resistance a rDS(on) VGS =2.5V, ID =3.6A 0.050 0.080 Ω Forward transconductance a gfs VDS =5V, ID =3.6A 8 S Diode forward voltage VSD IS=0.94A,VGS=0V 0.76 1.2 V Dynamic Total gate charge Qg 4.0 10 Gate-source charge Qgs 0.65 Gate-drain charge Qgd VDS =10V,VGS =4.5V,ID =3.6A 1.5 nC Input capacitance b Ciss 300 Output capacitance b Coss 120 Reverse transfer capacitance b Crss VDS =10V,VGS =0V,f=1MHz 80 pF Switching b Turn-on delay time td(on) 7 15 Rise time tr 55 80 Turn-off delay time td(off) 16 60 Fall time tf VDD=10V, RL=5.5Ω, ID ≈3.6A, VGEN=4.5V,Rg=6Ω 10 25 ns Notes : a. Pulse Test : Pulse width≤300µs, duty cycle ≤2%. b. These parameters have no way to verify. a T =25 ℃ unless otherwise specified Rev:2023A2 Rev:2023A2 2 SOT-23 Plastic-Encapsulate MOSFETS IRLML2502 IRLML2502 IRLML2502 |
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