SA5222 datasheet(2/8 Pages) PHILIPS

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Philips Semiconductors

Product specification

SA5222

Low-power FDDI transimpedance amplifier

1995 Apr 26

DC ELECTRICAL CHARACTERISTICS

Typical data and Min and Max limits apply at TA = 25°C, and VCC1 = VCC2 = +5V, unless otherwise specified.

SYMBOL

PARAMETER

TEST CONDITIONS

SA5222

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

Min

Typ

Max

UNIT

VIN

Input bias voltage

1.3

1.55

1.8

VO±

Output bias voltage

2.9

3.2

3.5

VOS

Output offset voltage

±100

ICC

Supply current

IOMAX

Output sink/source current

1.5

IIN

Input current (2% linearity)

Test circuit 5, Procedure 2

±60

±90

µA

IINMAX

Maximum input current overload threshold

Test circuit 5, Procedure 4

±80

±115

µA

VOMAX

Maximum differential output voltage swing

RL = ∞, Test Circuit 5, Procedure 3

3.6

VP-P

AC ELECTRICAL CHARACTERISTICS

Typical data and Min and Max limits apply at TA = 25°C and VCC1 = VCC2 =+5V, unless otherwise specified.

SYMBOL

PARAMETER

TEST CONDITIONS

SA5222

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

Min

Typ

Max

UNIT

Transresistance (differential output)

DC tested, RL = ∞, Test Circuit 5,

Procedure 1

13.3

16.6

19.9

Ω

Output resistance

(differential output)

DC tested

Ω

Transresistance

(single-ended output)

DC tested, RL = ∞

6.65

8.3

9.95

Ω

Output resistance

(single-ended output)

DC tested

Ω

f3dB

Bandwidth (-3dB)1

Test Circuit 1

110

140

MHz

RIN

Input resistance

150

Ω

CIN

Input capacitance2

∆R/∆V

Transresistance power supply sensitivity

VCC1 = VCC2 = 5 ±0.5V

1.0

%/V

∆R/∆T

Transresistance ambient temperature sensi-

tivity

∆TA = TA MAX - TA MIN

0.07

%/oC

IIN

RMS noise current spectral density (referred

to input)

Test Circuit 2, f = 10MHz

2.0

Integrated RMS noise current over the band-

width (referred to input)

Test circuit 2,

∆f = 50MHz

CS = 0pF

∆f = 100MHz

∆f = 150MHz

CS = 1pF

∆f = 50MHz

∆f = 100MHz

∆f = 150MHz

PSRR

Power supply rejection ratio

DC Tested,

∆VCC = ±0.5V

–55

PSRR

Power supply rejection ratio3

f = 1.0MHz, Test Circuit 3

–34

IINMAX

Maximum input amplitude for output duty

cycle of 50

±5%4

Test circuit 4

±120

µA

tr, tf

Rise and fall times

10 – 90%

2.2

Group delay

f = 10MHz

2.2

NOTES:

1. Bandwidth is tested into 50

Ω load. Bandwidth into 1kΩ load is approximately 165MHz.

2. Does not include Miller-multiplied capacitance of input device.

3. PSRR is output referenced and is circuit board layout dependent at higher frequencies. For best performance use a RF filter in VCC line.

4. Monitored in production via linearity and over load tests.

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