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TS1852AIN Datasheet(PDF) 7 Page - STMicroelectronics

Part # TS1852AIN
Description  1.8V INPUT/OUTPUT RAIL TO RAIL LOW POWER OPERATIONAL AMPLIFIERS
PDF  25 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

TS1852AIN Datasheet(HTML) 7 Page - STMicroelectronics

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TS1851-TS1852-TS1854
Electrical characteristics
7/25
Table 5.
Electrical characteristics measured at VCC = +5V, Vdd = 0V, with CL & RL connected to VCC/2,
Tamb = 25°C (unless otherwise specified)
(1)
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
Vio
Input offset voltage
Vicm = Vout = VCC/2
TS1851/2/4
Tmin ≤ Tamb ≤ Tmax
TS1851A/2A/4A
Tmin ≤ Tamb ≤ Tmax
0.1
3
6
1
1.5
mV
ΔVio
Input offset voltage drift
2
μV/°C
Iio
Input offset current
Vicm = Vout = VCC/2
(2)
Tmin ≤Tamb ≤Tmax
19
25
nA
Iib
Input bias current
Vicm = Vout = VCC/2
(2)
Tmin ≤Tamb ≤Tmax
16
63
93
nA
CMR
Common mode rejection ratio
20 log (
ΔVic/ΔVio)
0
≤Vicm ≤VCC
Tmin ≤Tamb ≤Tmax
65
62
95
dB
SVR
Supply voltage rejection ratio
20 log (
ΔVcc/ΔVio)
VCC = 1.8 to 5V
70
90
dB
Avd
Large signal voltage gain
Vout = 0.5V to 4V
RL = 10kΩ
RL = 2kΩ
85
77
97
93
dB
VOH
High level output voltage
Vid = 100mV
RL = 10kΩ
RL = 2kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 10kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 2kΩ
4.85
4.8
4.85
4.8
4.95
4.91
V
VOL
Low level output voltage
Vid = -100mV
RL = 10kΩ
RL = 2kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 10kΩ
Tmin ≤ Tamb ≤ Tmax, RL = 2kΩ
40
80
180
200
180
200
mV
Io
Output source current
Vid = 100mV, VO = VDD
248
mA
Output sink current
Vid = -100mV, VO = VCC
248
ICC
Supply current (per amplifier)
Vout = VCC/2
AVCL = 1, no load
Tmin ≤ Tamb ≤ Tmax
162
220
250
μA
GBP
Gain bandwidth product
RL = 10kΩ, CL = 100pF, f = 100kHz
380
630
kHz
SR
Slew rate
RL = 10kΩ, CL = 100pF, AV = 1
0.13
0.25
V/
μs
φm
Phase margin
CL = 100pF
60
Degrees
en
Input voltage noise
f = 1kHz
40
nV/
√Hz
THD
Total harmonic distortion
Vout=2Vpk-pk, AV=-1, f = 1kHz
0.01
%
1.
All parameter limits at temperatures other than 25°C are guaranteed by correlation.
2.
Maximum values include unavoidable inaccuracies of the industrial tests.



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