GSC24BC01/02/02/04/08/16

Page: 1/9

ISSUED DATE :2006/06/14

REVISED DATE :

G

2 - w i r e S e r i a l E E P R O M s 1 K / 2 K / 4 K / 8 K / 1 6 K

Description

The GSC24BC family provides 1K, 2K, 4K, 8K and 16K of serial electrically erasable and programmable

read-only memory (EEPROM). The wide Vdd range allows for low-voltage operation down to 1.8V. The device,

fabricated using traditional CMOS EEPROM technology, is optimized for many industrial and commercial

applications where low-voltage and low-power operation is essential. The device is accessed via a 2-wire serial

interface.

Features

512x8 (4K), 1024x8 (8K), 2048x8 (16K),

&Low-voltage and standard-voltage operation:

1.8V~5.5V

& ¯-wire serial interface bus

&Date retention: 100years

&High endurance: 1,000,000 Write Cycles

100KHz (1.8V) & 400KHz (5V) compatibility

&Bi-directional data transfer protocol

&Self-timed write cycle (5ms max)

&Write protect pin for hardware data protection

&8-byte page (1K, 2K) and 16-byte page (4K,8K,16K)

write modes

&Allows for partial page write

Package Dimensions

Millimeter

Millimeter

REF.

Min.

Max.

REF.

Min.

Max.

A

5.80

6.20

M

0.10

0.25

B

4.80

5.00

H

0.35

0.49

C

3.80

4.00

L

1.35

1.75

D

0°

8°

J

0.375 REF.

E

0.40

0.90

K

45°

F

0.19

0.25

G

1.27 TYP.

Figure 1. Pin Configurations

Pin Name

Function

A0 – A2

Address inputs

SDA

Serial Data

SCL

Serial Clock Input

WP

Write Protect

Gnd

Ground

Vcc

Power Supply

Absolute Maximum Ratings

Parameter

Ratings

Unit

Voltage on Any Pin with Respect to Ground

-0.8 to Vcc +1.5

V

Maximum Operating Voltage

6.25

V

DC Output Current

5.0

mA

Operating Temperature Range

-55 ~ +125

:

Storage Temperature Range

-65 ~ +150

:

Note: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress

rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of

these specifications are not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.