ML13156 datasheet(18/21 Pages) LANSDALE

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DESCRIPTION

The test setup shown in Figure 29 is configured so that the function

generator supplies a 100 kHz clock source to the bit error rate

tester. This device generates and receives a repeating data pattern

and drives a 5 pole baseband data filter. The filter effectively

reduces harmonic content of the base band data which is used to

modulate the RF generator which is running at 144.45 MHz.

Following processing of the signal by the receiver (ML13156), the

recovered baseband sinewave (data) is AC coupled to the data

slicer. The data slicer is essentially an auto–threshold comparator

which tracks the zero crossing of the incoming sinewave and pro-

vides logic level data at its output. Data errors associated with the

recovered data are collected by the bit error rate receiver and dis-

played.

Bit error rate versus RF signal input level and IF filter bandwidth

are shown in Figure 28. The bit error rate data was taken under the

following test conditions:

• Data rate = 100kbps

• Filter cutoff frequency set to 39% of the data rate or 39 kHz.

• Filter type is a 5 pole equal–ripple with 0.5° phase error.

• VCC = 4.0 Vdc

• Frequency deviation = ±32 kHz.

EVALUATION PC BOARD

The evaluation PCB is very versatile and is intended to be used

across the entire useful frequency range of this device. The center

section of the board provides an area for attaching all SMT compo-

nents to the component ground side (see Figures 32 and 33).

Additionally, the peripheral area surrounding the RF core provides

pads to add supporting and interface circuitry as a particular appli-

cation dictates

ML13156

LANSDALE Semiconductor, Inc.

BER TESTING AND PERORMANCE

–90

Figure 28. Bit Error Rate versus RF

Input Signal Level and IF Bandpass Filter

RF INPUT SIGNAL LEVEL (dBm)

–85

–80

–75

–70

10 –1

10 –5

10 –7

10 –3

IF Filter BW

110 kHz

IF Filter BW

230 kHz

VCC = 4.0 Vdc

Data Pattern = 2E09 Prbs NRZ

Baseband Filter fc = 50 kHz

fdev = ±32 kHz

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