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TPCP8901 Datasheet(PDF) 1 Page - Toshiba Semiconductor

Part # TPCP8901
Description  TOSHIBA Transistor Silicon NPN / PNP Epitaxial Type (PCT Process)
PDF  7 Pages
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TPCP8901 Datasheet(HTML) 1 Page - Toshiba Semiconductor

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TPCP8901
2006-11-13
1
TOSHIBA Transistor Silicon NPN / PNP Epitaxial Type (PCT Process)
TPCP8901
Portable Equipment Applications
Switching Applications
• Small footprint due to small and thin package
• High DC current gain : PNP hFE = 200 to 500 (IC = −0.1 A)
:NPN hFE = 400 to 1000 (IC = 0.1 A)
• Low collector-emitter saturation : PNP VCE (sat) = −0.20 V (max)
: NPN VCE (sat) = 0.17 V (max)
• High-speed switching : PNP tf = 70 ns (typ.)
: NPN tf = 85 ns (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Rating
Characteristics
Symbol
PNP
NPN
Unit
Collector-base voltage
VCBO
−50
100
V
Collector-emitter voltage
VCEO
−50
50
V
Emitter-base voltage
VEBO
−7
7
V
DC (Note 1)
IC
−0.8
1.0
Collector current
Pulse (Note 1 )
ICP
−5.0
5.0
A
Base current
IB
−100
100
mA
Single-device
operation
1.48
Collector power
dissipation (t = 10s)
Single-device
value at dual
operation
PC (Note 2)
0.80
W
Single-device
operation
0.83
Collector power
dissipation (DC)
Single-device
value at dual
operation
PC (Note 2)
0.48
W
Junction temperature
Tj
150
°C
Storage temperature range
Tstg
−55 to 150
°C
Note 1: Please use devices on condition that the junction temperature is below 150℃.
Icp=±5A (@ t≦100μs)
Note 2: Mounted on FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm
2)
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Unit: mm
JEDEC
―
JEITA
―
TOSHIBA
2-3V1C
Weight: 0.017 g (typ.)
0.33±0.05
0.28+0.1
-0.11
1.12+0.13
-0.12
0.475
0.65
A
0.05 M
2.9±0.1
4
1
5
8
0.8±0.05
0.17±0.02
B
B
0.05 M
A
S
0.025
S
1.12+0.13
-0.12
0.28+0.1
-0.11
1.Emitter1
2.Base1
3.Emitter2
4.Base2
5.Collector2
6.Collector2
7.Collector1
8.Collector1


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