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TLP102 Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TLP102 Datasheet(HTML) 5 Page - Toshiba Semiconductor |
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5 / 6 page ![]() TLP102 2005-04-22 5 TEST CIRCUIT 7: Switching Time Test Circuit V CC VCC GND SHIELD IF V O 0.1uF C L V O IF VOH VOL tpLH tpHL 1.3V 50% tf tr 90% 10% TEST CIRCUIT 8: Switching Time Test Circuit VCC GND SHIELD VO 0.1uF CL VCC IF 5V 620Ω 5kΩ V O IF VOH VOL tpLH tpHL 1.3V 50% tf tr 90% 10% TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit 0.1uF VO V CC SW IF 1 3 6 5 4 VC M A B → CM L CM H VCM 10% 90% 1000V ・SW B : IF=0mA ・SW A : IF=5mA 1V 17V V O tr tf VCC GND SHIELD ) ( ) ( 800 s t r V H CM μ = ) ( ) ( 800 s t f V L CM μ = CL: stray capacitance of probe and wiring (to 15 pF) |
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