SN74HC10EP

TRIPLE 3INPUT POSITIVENAND GATE

SCLS558 − JANUARY 2004

1

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

D Controlled Baseline

− One Assembly/Test Site, One Fabrication

Site

D Extended Temperature Performance of

−40

°C to 125°C

D Enhanced Diminishing Manufacturing

Sources (DMS) Support

D Enhanced Product-Change Notification

D Qualification Pedigree†

D Wide Operating Voltage Range of 2 V to 6 V

† Component qualification in accordance with JEDEC and industry

standards to ensure reliable operation over an extended

temperature range. This includes, but is not limited to, Highly

Accelerated Stress Test (HAST) or biased 85/85, temperature

cycle, autoclave or unbiased HAST, electromigration, bond

intermetallic life, and mold compound life. Such qualification

testing should not be viewed as justifying use of this component

beyond specified performance and environmental limits.

D Outputs Can Drive Up To 10 LSTTL Loads

D Low Power Consumption, 20-µA Max ICC

D Typical tpd = 9 ns

D ±4-mA Output Drive at 5 V

D Low Input Current of 1 µA Max

description/ordering information

The SN74HC10 device contains three independent 3-input NAND gates. It performs the Boolean function

Y = A

• B • C or Y = A + B + C in positive logic.

ORDERING INFORMATION

TA

PACKAGE‡

ORDERABLE

PART NUMBER

TOP-SIDE

MARKING

−40

°C to 125°C

SOIC − D

Tape and reel

SN74HC10QDREP

SHC10EP

−40

°C to 125°C

TSSOP − PW

Tape and reel

SN74HC10QPWREP

SHC10EP

‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are

available at www.ti.com/sc/package.

FUNCTION TABLE

(each gate)

INPUTS

OUTPUT

A

B

C

OUTPUT

Y

H

H

H

L

L

XX

H

X

LX

H

X

X

L

H

logic diagram (positive logic)

A

C

Y

B

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

2A

2B

2C

2Y

GND

VCC

1C

1Y

3C

3B

3A

3Y

D OR PW PACKAGE

(TOP VIEW)

Copyright

 2004, Texas Instruments Incorporated

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.