TLV2332, TLV2332Y, TLV2334, TLV2334Y

LinCMOS

™ LOW-VOLTAGE MEDIUM-POWER

OPERATIONAL AMPLIFIERS

SLOS189 – FEBRUARY 1997

22

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

single-supply versus split-supply test circuits

Because the TLV233x is optimized for single-supply operation, circuit configurations used for the various tests

often present some inconvenience since the input signal, in many cases, must be offset from ground. This

inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative

rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives

the same result.

–

+

–

+

VDD

VO

RL

CL

VI

RL

CL

VO

VDD +

VI

VDD –

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

Figure 34. Unity-Gain Amplifier

–

+

–

+

VDD

VDD +

VDD –

VO

VO

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

20

Ω

20

Ω

20

Ω

20

Ω

1/2 VDD

2 k

Ω

2 k

Ω

Figure 35. Noise-Test Circuit

–

+

–

+

10 k

Ω

1/2 VDD

100

Ω

VO

VDD

VI

VI

100

Ω

(a) SINGLE SUPPLY

(b) SPLIT SUPPLY

10 k

Ω

VDD +

VDD –

CL

CL

VO

Figure 36. Gain-of-100 Inverting Amplifier