ADS1242, 1243

2

SBAS235H

www.ti.com

DIGITAL CHARACTERISTICS: TMIN to TMAX, VDD 2.7V to 5.25V

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Digital Input/Output

Logic Family

CMOS

Logic Level: VIH

0.8 • VDD

VDD

V

VIL(1)

GND

0.2 • VDD

V

VOH

IOH = 1mA

VDD – 0.4

V

VOL

IOL = 1mA

GND

GND + 0.4

V

Input Leakage: IIH

VI = VDD

10

µA

IIL

VI = 0

–10

µA

Master Clock Rate: fOSC

15

MHz

Master Clock Period: tOSC

1/fOSC

200

1000

ns

NOTE: (1) VIL for XIN is GND to GND + 0.05V.

ELECTROSTATIC

DISCHARGE SENSITIVITY

This integrated circuit can be damaged by ESD. Texas Instru-

ments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling

and installation procedures can cause damage.

ESD damage can range from subtle performance degradation

to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric

changes could cause the device not to meet its published

specifications.

VDD to GND ........................................................................... –0.3V to +6V

Input Current ............................................................... 100mA, Momentary

Input Current ................................................................. 10mA, Continuous

AIN .................................................................... GND – 0.5V to VDD + 0.5V

Digital Input Voltage to GND ...................................... –0.3V to VDD + 0.3V

Digital Output Voltage to GND ................................... –0.3V to VDD + 0.3V

Maximum Junction Temperature ................................................... +150

°C

Operating Temperature Range ......................................... –40

°C to +85°C

Storage Temperature Range .......................................... –60

°C to +100°C

NOTE: (1) Stresses above those listed under

Absolute Maximum Ratings may

cause permanent damage to the device. Exposure to absolute maximum

conditions for extended periods may affect device reliability.

ABSOLUTE MAXIMUM RATINGS(1)

For the most current package and ordering information, see

the Package Option Addendum at the end of this document,

or see the TI website at www.ti.com.

PACKAGE/ORDERING INFORMATION